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OSSADNIK C, VEPREK S and REGORA I G. Applicability of Raman Scattering for the Characterization of Microcrystalline Silicon [J]. The Solid Films, 1999,337:148~151.
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OSSADNIK C, VEPREK S and REGORA I G. Applicability of Raman Scattering for the Characterization of Microcrystalline Silicon [J]. The Solid Films, 1999,337:148~151.
求改文献的析出文献及出版者
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