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cjl1980

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[求助] 【求助】求助文献，有限期2011年9月8日

OSSADNIK C, VEPREK S and REGORA I G. Applicability of Raman Scattering for the Characterization of Microcrystalline Silicon [J]. The Solid Films, 1999,337:148~151.
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cjl1980(金币+1, 博学EPI+1): 无效回帖，但奖励一个金币 2011-09-07 10:17:19

References
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