µ±Ç°Î»Ö㺠Ê×Ò³ > ÂÛÎÄͶ¸å >beam intensityµÄµ¥Î»£¡

beam intensityµÄµ¥Î»£¡

×÷Õß °¡°¡°¡·þÁÉ
À´Ô´: Сľ³æ 150 3 ¾Ù±¨Ìû×Ó
+¹Ø×¢

Èçͼ¡£
ÇëÎÊ´ó¼Ò£º
1£©É¨Ãèµç¾µÄÜÆ×ÖÐbeam intensityÊǵç×ÓÊøÇ¿¶ÈÂð£¿
2£©µ¥Î»ÊÇʲô£¿Èí¼þÖÐûÓбêÃ÷µ¥Î»¡£ÊÇcpsÂð£¿

 ·µ»ØÐ¡Ä¾³æ²é¿´¸ü¶à

½ñÈÕÈÈÌû
  • ¾«»ªÆÀÂÛ
  • a573294759

    Êǵç×ÓÊøµÄÇ¿¶È

  • °¡°¡°¡·þÁÉ

    [²¹³ä˵Ã÷]ͼΪ²âÊÔSEM-EDSʱµÄ¹¤×÷²ÎÊý¡£µç¾µÐͺÅΪ£ºVEGA 3XMU SEM (Tescan, Czech Republic)£»ÄÜÆ×ÐͺÅΪ£ºINCA X-Act energy-dispersive X-ray micro-analyser (Oxford Instruments plc, UK)¡£
    ¸ù¾ÝʵÑéÊÒÀÏʦµÄÖ¸µ¼£¬ÔÚSEM¹Û²ìʱ£¬beam intensityÊýÖµÐèÒªÔÚ10.00×óÓÒ£¬SEM-EDS²âÊÔʱÔÚ14.00×óÓÒÄܵõ½½ÏºÃµÄÔªËØ·ÖÎöЧ¹û¡£Çë½ÌʵÑéÊÒÀÏʦËý˵Êǵç×ÓÊøÁ÷Ç¿¶È£¬µ¥Î»¿ÉÄÜΪcps£¨¼ÆÊýÂÊ£©¡£
    ÄÄλ´óÀаïæ½â»ó£¬¸Ð¼¤²»¾£¬

²ÂÄãϲ»¶
ÏÂÔØÐ¡Ä¾³æAPP
Óë700Íò¿ÆÑдïÈËËæÊ±½»Á÷
  • ¶þάÂë
  • IOS
  • °²×¿