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左胸膛

新虫 (初入文坛)

[求助] 请大家帮个忙,查两篇会议论文是否被EI收录

(1)题目:Simulation for several kinds of TEM horn antenna used by NEMP simulator
作者: Yun Wang, Yong-guang Chen, Qing-guo Wang
(2)题目:Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device
作者:Zhao Min, Qu Zhao-ming, Zhang Li, Wang Yun, and Wang Qing-guo

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左胸膛

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3楼: Originally posted by wpq113 at 2018-01-04 10:21:25
Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device
Accession number: 20174504375709
Authors: Min, Zhao 1   ; Zhaoming, Qu 1 ; Li, Zhang 1 ; Yun,  ...

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4楼2018-01-04 15:03:38
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wpq113

至尊木虫 (著名写手)


【答案】应助回帖

感谢参与,应助指数 +1
Simulation for several kinds of TEM horn antenna used by NEMP simulator
Accession number: 20174504376075
Authors: Wang, Yun 1 ; Chen, Yongguang 2 ; Fan, Lisi 1
Author affiliations : 1 Electrostatic and Electromagnetic Protection Institute, Ordnance Engineering College, Shijiazhuang; 050003, China
2 Beijing Institute of Tracking and Telecommunications Technology, Beijing; 100094, China
Source title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Abbreviated source title: Int. Appl. Comput. Electromagn. Soc. Symp. China, ACES-China
Part number: 1 of 1
Issue title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Issue date: September 26, 2017
Publication Year: 2017
Article number: 8051716
Language: English
ISBN-13: 9780996007856
Document type: Conference article (CA)
Conference name: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Conference date: August 1, 2017 - August 4, 2017
Conference location: Suzhou, China
Conference code: 130932
Sponsor: Altair; EMC State Key Laboratory; MEDs Technologies; MICM National Key Laboratory; Nanjing University of Science and Technology
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Aiming at improving the radiation direction of the radiating high altitude nuclear electromagnetic pulse(NEMP) simulator, Transverse electromagnetic(TEM) horn antenna is adopted as the radiating antenna for the simulator in this paper. Several structures are simulated using the CST microwave studios software. Results suggest that TEM horn antenna can be used by NEMP simulators with some limitations; the near field waveform is closer to standard waveform than far field one; the structures of impedance loading and low frequency compensation have limited effect on improving the antenna's radiation performance; the other two structures of impedance with gradually exponential changing and edges rolling can perfect the radiation waveforms greatly. © 2017 Applied Computational Electromagnetics Society.
Number of references: 8
Main heading: Horn antennas
Controlled terms: Antennas -  Computational electromagnetics -  Electromagnetic pulse -  Simulators
Uncontrolled terms: Antenna simulations -  CST microwave studio -  Low-frequency-compensation -  Nuclear electromagnetic pulse -  Radiation direction -  Radiation performance -  TEM horn antenna -  Transverse electromagnetic horns
Classification code: 701Electricity and Magnetism
Database: Compendex
Compilation and indexing terms, © 2018 Elsevier Inc.
2楼2018-01-04 10:19:57
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wpq113

至尊木虫 (著名写手)


【答案】应助回帖

★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★
左胸膛(lazy锦溪代发): 金币+20 2018-01-08 21:30:19
lazy锦溪: LS-EPI+1 2018-01-08 21:30:24
Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device
Accession number: 20174504375709
Authors: Min, Zhao 1   ; Zhaoming, Qu 1 ; Li, Zhang 1 ; Yun, Wang 1 ; Qingguo, Wang 1
Author affiliation : 1 Mechanical Engineering College, ShiJiaZhuang; 050003, China
Corresponding author: Min, Zhao (zhao_min_2012@126.com)
Source title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Abbreviated source title: Int. Appl. Comput. Electromagn. Soc. Symp. China, ACES-China
Part number: 1 of 1
Issue title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Issue date: September 26, 2017
Publication Year: 2017
Article number: 8051900
Language: English
ISBN-13: 9780996007856
Document type: Conference article (CA)
Conference name: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Conference date: August 1, 2017 - August 4, 2017
Conference location: Suzhou, China
Conference code: 130932
Sponsor: Altair; EMC State Key Laboratory; MEDs Technologies; MICM National Key Laboratory; Nanjing University of Science and Technology
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Field-induced electromagnetic shielding material show an abrupt decrease of resistance when external electromagnetic field exceeds a threshold value, the material will occur metal-insulator transition phenomena in the nanosecond time, Owing to threshold value was so high that traditional static test method and low-voltage dynamic test can not satisfy test require. According impedance matching principle and time domin reflection, two kinds of dynamic test device are designed, the working principle of them are compared and analyed, pulsed measurement show that the test device based on time domin relection is more correct and directly. © 2017 Applied Computational Electromagnetics Society.
Number of references: 6
Main heading: Electromagnetic shielding
Controlled terms: Computational electromagnetics -  Electromagnetic fields -  Impedance matching (electric) -  Magnetic materials -  Metal insulator boundaries -  Metal insulator transition -  Semiconductor insulator boundaries -  Shielding -  Testing
Uncontrolled terms: Comparative analysis -  Dynamic test devices -  External electromagnetic field -  Field induced -  Impedance matchings -  Pulsed measurements -  Threshold-value -  time domin relection
Classification code: 701Electricity and Magnetism  -  708.4Magnetic Materials  -  714.2Semiconductor Devices and Integrated Circuits
Database: Compendex
Compilation and indexing terms, © 2018 Elsevier Inc.
3楼2018-01-04 10:21:25
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