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【答案】应助回帖
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左胸膛(lazy锦溪代发): 金币+20 2018-01-08 21:30:19
lazy锦溪: LS-EPI+1 2018-01-08 21:30:24
Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device
Accession number: 20174504375709
Authors: Min, Zhao 1 ; Zhaoming, Qu 1 ; Li, Zhang 1 ; Yun, Wang 1 ; Qingguo, Wang 1
Author affiliation : 1 Mechanical Engineering College, ShiJiaZhuang; 050003, China
Corresponding author: Min, Zhao (zhao_min_2012@126.com)
Source title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Abbreviated source title: Int. Appl. Comput. Electromagn. Soc. Symp. China, ACES-China
Part number: 1 of 1
Issue title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Issue date: September 26, 2017
Publication Year: 2017
Article number: 8051900
Language: English
ISBN-13: 9780996007856
Document type: Conference article (CA)
Conference name: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017
Conference date: August 1, 2017 - August 4, 2017
Conference location: Suzhou, China
Conference code: 130932
Sponsor: Altair; EMC State Key Laboratory; MEDs Technologies; MICM National Key Laboratory; Nanjing University of Science and Technology
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Field-induced electromagnetic shielding material show an abrupt decrease of resistance when external electromagnetic field exceeds a threshold value, the material will occur metal-insulator transition phenomena in the nanosecond time, Owing to threshold value was so high that traditional static test method and low-voltage dynamic test can not satisfy test require. According impedance matching principle and time domin reflection, two kinds of dynamic test device are designed, the working principle of them are compared and analyed, pulsed measurement show that the test device based on time domin relection is more correct and directly. © 2017 Applied Computational Electromagnetics Society.
Number of references: 6
Main heading: Electromagnetic shielding
Controlled terms: Computational electromagnetics - Electromagnetic fields - Impedance matching (electric) - Magnetic materials - Metal insulator boundaries - Metal insulator transition - Semiconductor insulator boundaries - Shielding - Testing
Uncontrolled terms: Comparative analysis - Dynamic test devices - External electromagnetic field - Field induced - Impedance matchings - Pulsed measurements - Threshold-value - time domin relection
Classification code: 701Electricity and Magnetism - 708.4Magnetic Materials - 714.2Semiconductor Devices and Integrated Circuits
Database: Compendex
Compilation and indexing terms, © 2018 Elsevier Inc. |
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