| 查看: 594 | 回复: 3 | ||
| 本帖产生 1 个 ，点击这里进行查看 | ||
[求助]
请大家帮个忙，查两篇会议论文是否被EI收录
|
||
|
（1）题目：Simulation for several kinds of TEM horn antenna used by NEMP simulator 作者： Yun Wang, Yong-guang Chen, Qing-guo Wang (2)题目：Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device 作者：Zhao Min, Qu Zhao-ming, Zhang Li, Wang Yun, and Wang Qing-guo 发自小木虫IOS客户端 |
回复此楼» 猜你喜欢
建议基金发布提前给出明确的时间点
已经有14人回复
-
范进中举一文的中心思想
已经有5人回复
-
2026国自然函评费到账
已经有17人回复
-
让我中一个面上吧！
已经有15人回复
-
2026年的国家社科基金项目通讯评审的新规则与新动向、新挑战
已经有5人回复
-
跳槽后在研项目怎么办？
已经有10人回复
-
什么时候开奖？
已经有10人回复
-
今天放榜吗？
已经有16人回复
-
93BebMhtakh前后11位开头都是大写
已经有8人回复
-
只有每年这种时候来逛逛小木虫
已经有26人回复
wpq113 
至尊木虫 (著名写手)
- 应助: 23 (小学生)
- 金币: 21971.3
- 散金: 9
- 红花: 6
- 沙发: 2
- 帖子: 1985
- 在线: 1714.6小时
- 虫号: 328579
- 注册: 2007-03-21
- 专业: 计算机应用技术
【答案】应助回帖
感谢参与，应助指数 +1
|
Simulation for several kinds of TEM horn antenna used by NEMP simulator Accession number: 20174504376075 Authors: Wang, Yun 1 ; Chen, Yongguang 2 ; Fan, Lisi 1 Author affiliations : 1 Electrostatic and Electromagnetic Protection Institute, Ordnance Engineering College, Shijiazhuang; 050003, China 2 Beijing Institute of Tracking and Telecommunications Technology, Beijing; 100094, China Source title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Abbreviated source title: Int. Appl. Comput. Electromagn. Soc. Symp. China, ACES-China Part number: 1 of 1 Issue title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Issue date: September 26, 2017 Publication Year: 2017 Article number: 8051716 Language: English ISBN-13: 9780996007856 Document type: Conference article (CA) Conference name: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Conference date: August 1, 2017 - August 4, 2017 Conference location: Suzhou, China Conference code: 130932 Sponsor: Altair; EMC State Key Laboratory; MEDs Technologies; MICM National Key Laboratory; Nanjing University of Science and Technology Publisher: Institute of Electrical and Electronics Engineers Inc. Abstract: Aiming at improving the radiation direction of the radiating high altitude nuclear electromagnetic pulse(NEMP) simulator, Transverse electromagnetic(TEM) horn antenna is adopted as the radiating antenna for the simulator in this paper. Several structures are simulated using the CST microwave studios software. Results suggest that TEM horn antenna can be used by NEMP simulators with some limitations; the near field waveform is closer to standard waveform than far field one; the structures of impedance loading and low frequency compensation have limited effect on improving the antenna's radiation performance; the other two structures of impedance with gradually exponential changing and edges rolling can perfect the radiation waveforms greatly. © 2017 Applied Computational Electromagnetics Society. Number of references: 8 Main heading: Horn antennas Controlled terms: Antennas - Computational electromagnetics - Electromagnetic pulse - Simulators Uncontrolled terms: Antenna simulations - CST microwave studio - Low-frequency-compensation - Nuclear electromagnetic pulse - Radiation direction - Radiation performance - TEM horn antenna - Transverse electromagnetic horns Classification code: 701Electricity and Magnetism Database: Compendex Compilation and indexing terms, © 2018 Elsevier Inc. |
2楼2018-01-04 10:19:57
wpq113
至尊木虫 (著名写手)
- 应助: 23 (小学生)
- 金币: 21971.3
- 散金: 9
- 红花: 6
- 沙发: 2
- 帖子: 1985
- 在线: 1714.6小时
- 虫号: 328579
- 注册: 2007-03-21
- 专业: 计算机应用技术
【答案】应助回帖
★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★
左胸膛(lazy锦溪代发): 金币+20 2018-01-08 21:30:19
lazy锦溪: LS-EPI+1 2018-01-08 21:30:24
左胸膛(lazy锦溪代发): 金币+20 2018-01-08 21:30:19
lazy锦溪: LS-EPI+1 2018-01-08 21:30:24
|
Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device Accession number: 20174504375709 Authors: Min, Zhao 1 ; Zhaoming, Qu 1 ; Li, Zhang 1 ; Yun, Wang 1 ; Qingguo, Wang 1 Author affiliation : 1 Mechanical Engineering College, ShiJiaZhuang; 050003, China Corresponding author: Min, Zhao (zhao_min_2012@126.com) Source title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Abbreviated source title: Int. Appl. Comput. Electromagn. Soc. Symp. China, ACES-China Part number: 1 of 1 Issue title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Issue date: September 26, 2017 Publication Year: 2017 Article number: 8051900 Language: English ISBN-13: 9780996007856 Document type: Conference article (CA) Conference name: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Conference date: August 1, 2017 - August 4, 2017 Conference location: Suzhou, China Conference code: 130932 Sponsor: Altair; EMC State Key Laboratory; MEDs Technologies; MICM National Key Laboratory; Nanjing University of Science and Technology Publisher: Institute of Electrical and Electronics Engineers Inc. Abstract: Field-induced electromagnetic shielding material show an abrupt decrease of resistance when external electromagnetic field exceeds a threshold value, the material will occur metal-insulator transition phenomena in the nanosecond time, Owing to threshold value was so high that traditional static test method and low-voltage dynamic test can not satisfy test require. According impedance matching principle and time domin reflection, two kinds of dynamic test device are designed, the working principle of them are compared and analyed, pulsed measurement show that the test device based on time domin relection is more correct and directly. © 2017 Applied Computational Electromagnetics Society. Number of references: 6 Main heading: Electromagnetic shielding Controlled terms: Computational electromagnetics - Electromagnetic fields - Impedance matching (electric) - Magnetic materials - Metal insulator boundaries - Metal insulator transition - Semiconductor insulator boundaries - Shielding - Testing Uncontrolled terms: Comparative analysis - Dynamic test devices - External electromagnetic field - Field induced - Impedance matchings - Pulsed measurements - Threshold-value - time domin relection Classification code: 701Electricity and Magnetism - 708.4Magnetic Materials - 714.2Semiconductor Devices and Integrated Circuits Database: Compendex Compilation and indexing terms, © 2018 Elsevier Inc. |
3楼2018-01-04 10:21:25
4楼2018-01-04 15:03:38
40