| 查看: 487 | 回复: 3 | |||
| 本帖产生 1 个 ,点击这里进行查看 | |||
[求助]
请大家帮个忙,查两篇会议论文是否被EI收录
|
|||
|
(1)题目:Simulation for several kinds of TEM horn antenna used by NEMP simulator 作者: Yun Wang, Yong-guang Chen, Qing-guo Wang (2)题目:Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device 作者:Zhao Min, Qu Zhao-ming, Zhang Li, Wang Yun, and Wang Qing-guo 发自小木虫IOS客户端 |
» 猜你喜欢
遇见不省心的家人很难过
已经有24人回复
依托企业入选了国家启明计划青年人才。有无高校可以引进的。
已经有6人回复
博士延得我,科研能力直往上蹿
已经有9人回复
天津大学招2026.09的博士生,欢迎大家推荐交流(博导是本人)
已经有6人回复
AI 太可怕了,写基金时,提出想法,直接生成的文字比自己想得深远,还有科学性
已经有6人回复
有院领导为了换新车,用横向课题经费买了俩车
已经有9人回复
酰胺脱乙酰基
已经有13人回复
同年申请2项不同项目,第1个项目里不写第2个项目的信息,可以吗
已经有4人回复
有时候真觉得大城市人没有县城人甚至个体户幸福
已经有10人回复
wpq113
至尊木虫 (著名写手)
- 应助: 23 (小学生)
- 金币: 21546.8
- 散金: 9
- 红花: 6
- 沙发: 2
- 帖子: 1985
- 在线: 1714.4小时
- 虫号: 328579
- 注册: 2007-03-21
- 专业: 计算机应用技术
【答案】应助回帖
感谢参与,应助指数 +1
|
Simulation for several kinds of TEM horn antenna used by NEMP simulator Accession number: 20174504376075 Authors: Wang, Yun 1 ; Chen, Yongguang 2 ; Fan, Lisi 1 Author affiliations : 1 Electrostatic and Electromagnetic Protection Institute, Ordnance Engineering College, Shijiazhuang; 050003, China 2 Beijing Institute of Tracking and Telecommunications Technology, Beijing; 100094, China Source title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Abbreviated source title: Int. Appl. Comput. Electromagn. Soc. Symp. China, ACES-China Part number: 1 of 1 Issue title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Issue date: September 26, 2017 Publication Year: 2017 Article number: 8051716 Language: English ISBN-13: 9780996007856 Document type: Conference article (CA) Conference name: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Conference date: August 1, 2017 - August 4, 2017 Conference location: Suzhou, China Conference code: 130932 Sponsor: Altair; EMC State Key Laboratory; MEDs Technologies; MICM National Key Laboratory; Nanjing University of Science and Technology Publisher: Institute of Electrical and Electronics Engineers Inc. Abstract: Aiming at improving the radiation direction of the radiating high altitude nuclear electromagnetic pulse(NEMP) simulator, Transverse electromagnetic(TEM) horn antenna is adopted as the radiating antenna for the simulator in this paper. Several structures are simulated using the CST microwave studios software. Results suggest that TEM horn antenna can be used by NEMP simulators with some limitations; the near field waveform is closer to standard waveform than far field one; the structures of impedance loading and low frequency compensation have limited effect on improving the antenna's radiation performance; the other two structures of impedance with gradually exponential changing and edges rolling can perfect the radiation waveforms greatly. © 2017 Applied Computational Electromagnetics Society. Number of references: 8 Main heading: Horn antennas Controlled terms: Antennas - Computational electromagnetics - Electromagnetic pulse - Simulators Uncontrolled terms: Antenna simulations - CST microwave studio - Low-frequency-compensation - Nuclear electromagnetic pulse - Radiation direction - Radiation performance - TEM horn antenna - Transverse electromagnetic horns Classification code: 701Electricity and Magnetism Database: Compendex Compilation and indexing terms, © 2018 Elsevier Inc. |
2楼2018-01-04 10:19:57
wpq113
至尊木虫 (著名写手)
- 应助: 23 (小学生)
- 金币: 21546.8
- 散金: 9
- 红花: 6
- 沙发: 2
- 帖子: 1985
- 在线: 1714.4小时
- 虫号: 328579
- 注册: 2007-03-21
- 专业: 计算机应用技术
【答案】应助回帖
★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★
左胸膛(lazy锦溪代发): 金币+20 2018-01-08 21:30:19
lazy锦溪: LS-EPI+1 2018-01-08 21:30:24
左胸膛(lazy锦溪代发): 金币+20 2018-01-08 21:30:19
lazy锦溪: LS-EPI+1 2018-01-08 21:30:24
|
Comparative analysis on field-induced electromagnetic shielding material with two kinds of test device Accession number: 20174504375709 Authors: Min, Zhao 1 ; Zhaoming, Qu 1 ; Li, Zhang 1 ; Yun, Wang 1 ; Qingguo, Wang 1 Author affiliation : 1 Mechanical Engineering College, ShiJiaZhuang; 050003, China Corresponding author: Min, Zhao (zhao_min_2012@126.com) Source title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Abbreviated source title: Int. Appl. Comput. Electromagn. Soc. Symp. China, ACES-China Part number: 1 of 1 Issue title: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Issue date: September 26, 2017 Publication Year: 2017 Article number: 8051900 Language: English ISBN-13: 9780996007856 Document type: Conference article (CA) Conference name: 2017 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2017 Conference date: August 1, 2017 - August 4, 2017 Conference location: Suzhou, China Conference code: 130932 Sponsor: Altair; EMC State Key Laboratory; MEDs Technologies; MICM National Key Laboratory; Nanjing University of Science and Technology Publisher: Institute of Electrical and Electronics Engineers Inc. Abstract: Field-induced electromagnetic shielding material show an abrupt decrease of resistance when external electromagnetic field exceeds a threshold value, the material will occur metal-insulator transition phenomena in the nanosecond time, Owing to threshold value was so high that traditional static test method and low-voltage dynamic test can not satisfy test require. According impedance matching principle and time domin reflection, two kinds of dynamic test device are designed, the working principle of them are compared and analyed, pulsed measurement show that the test device based on time domin relection is more correct and directly. © 2017 Applied Computational Electromagnetics Society. Number of references: 6 Main heading: Electromagnetic shielding Controlled terms: Computational electromagnetics - Electromagnetic fields - Impedance matching (electric) - Magnetic materials - Metal insulator boundaries - Metal insulator transition - Semiconductor insulator boundaries - Shielding - Testing Uncontrolled terms: Comparative analysis - Dynamic test devices - External electromagnetic field - Field induced - Impedance matchings - Pulsed measurements - Threshold-value - time domin relection Classification code: 701Electricity and Magnetism - 708.4Magnetic Materials - 714.2Semiconductor Devices and Integrated Circuits Database: Compendex Compilation and indexing terms, © 2018 Elsevier Inc. |
3楼2018-01-04 10:21:25
4楼2018-01-04 15:03:38













回复此楼