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ÒÔGaN Systems Inc.(Ottawa,CA)ΪÉêÇëÈ˼ìË÷µ½2¸öרÀû [ÃÀ¹ú¹«¿ª] DEVICES AND SYSTEMS FOR POWER CONVERSION CIRCUITS- US14105569 ÉêÇëÈË£º GAN SYSTEMS INC.(Ottawa,CA) ÉêÇëÈÕ£º 2013-12-13 - Ö÷·ÖÀàºÅ£º H01L 25/18 20060101 [ÃÀ¹úÊÚȨ] High density gallium nitride devices using island topology- US13641003 ÉêÇëÈË£º GaN Systems Inc.(Ottawa,CA) ÉêÇëÈÕ£º 2011-04-13 - Ö÷·ÖÀàºÅ£º H01L 23/528 20060101 |

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1.EPO¼ìË÷ ¡°gan systems¡± 6¸öרÀû£¬·Ö±ðΪ£º "FAULT TOLERANT DESIGN FOR LARGE AREA NITRIDE SEMICONDUCTOR DEVICES" US2015162252 (A1) "FAULT TOLERANT DESIGN FOR LARGE AREA NITRIDE SEMICONDUCTOR DEVICES" WO2015061881 (A1) "DEVICES AND SYSTEMS COMPRISING DRIVERS FOR POWER CONVERSION CIRCUITS" WO2014094115 (A1) "HIGH DENSITY GALLIUM NITRIDE DEVICES USING ISLAND TOPOLOGY" KR20130088743 (A) "Gallium nitride power devices using island topography" TW201234538 (A) "ISLAND MATRIXED GALLIUM NITRIDE MICROWAVE AND POWER SWITCHING TRANSISTORS" US9064947 (B2); US2012138950 (A1) 2¡¢¼ìË÷ͬ×åרÀû WO2015061881 (A1)ͬ×åרÀû£º "FAULT TOLERANT DESIGN FOR LARGE AREA NITRIDE SEMICONDUCTOR DEVICES" WO2015061881 (A1) "Island matrixed gallium nitride microwave and power switching transistors" AU2010281317 (A1) "High density gallium nitride devices using island topology" AU2011241423 (A1) "ISLAND MATRIXED GALLIUM NITRIDE MICROWAVE AND POWER SWITCHING TRANSISTORS" CA2769940 (A1) "HIGH DENSITY GALLIUM NITRIDE DEVICES USING ISLAND TOPOLOGY" CA2796155 (A1); CA2796155 (C) "High density gallium nitride devices using island topology" CN102893392 (A); CN102893392 (B) "ISLAND MATRIXED GALLIUM NITRIDE MICROWAVE AND POWER SWITCHING TRANSISTORS" EP2465141 (A1) "HIGH DENSITY GALLIUM NITRIDE DEVICES USING ISLAND TOPOLOGY" EP2559064 (A1) "ISLAND MATRIXED GALLIUM NITRIDE MICROWAVE AND POWER SWITCHING TRANSISTORS" JP2013501362 (A) "HIGH DENSITY GALLIUM NITRIDE DEVICES USING ISLAND TOPOLOGY" JP2013528930 (A) "ISLAND MATRIXED GALLIUM NITRIDE MICROWAVE AND POWER SWITCHING TRANSISTORS" KR20120041237 (A) "HIGH DENSITY GALLIUM NITRIDE DEVICES USING ISLAND TOPOLOGY" KR20130088743 (A) "Gallium nitride power devices using island topography" TW201234538 (A) "HIGH DENSITY GALLIUM NITRIDE DEVICES USING ISLAND TOPOLOGY" US2013049010 (A1); US8791508 (B2) "Gallium Nitride Power Devices Using Island Topography" US2011186858 (A1); US9029866 (B2) "ISLAND MATRIXED GALLIUM NITRIDE MICROWAVE AND POWER SWITCHING TRANSISTORS" US9064947 (B2); US2012138950 (A1) "FAULT TOLERANT DESIGN FOR LARGE AREA NITRIDE SEMICONDUCTOR DEVICES" US2015162252 (A1) "ISLAND MATRIXED GALLIUM NITRIDE MICROWAVE AND POWER SWITCHING TRANSISTORS" WO2011014951 (A1) "HIGH DENSITY GALLIUM NITRIDE DEVICES USING ISLAND TOPOLOGY" WO2011127568 (A1); WO2011127568 (A4) "GALLIUM NITRIDE POWER DEVICES USING ISLAND TOPOGRAPHY" WO2012103633 (A1) 3.Ó÷¢Ã÷È˼ìË÷ ×ÔÐÐÈ¥epo¼ìË÷°É |
6Â¥2015-09-20 21:38:34
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7Â¥2015-09-20 21:40:39














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