24小时热门版块排行榜

返回列表

【奖励】本帖被评价147次，作者shileijerry增加金币 116.4 个

当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖

shileijerry

至尊木虫 (知名作家)

应助: 7 (幼儿园)
金币: 53735.8
帖子: 5466
在线: 728.9小时
虫号: 1189666

[资源] 材料表征的物理方法（Physical methods for materials characterisation）

Physical methods for materials characterisation

Author(s): Peter E.J. Flewitt, R.K. Wild
Series: Series in Material Science and Engineering
Publisher: Taylor & Francis
City: New York
Year: 2001
Edition: 2nd
Language: English
Pages: 595

In the second edition of this popular text, the authors provide a comprehensive description of the range of techniques currently used for characterizing the microstructure of materials. Introductory chapters cover the basic physics required to describe the microstructure of materials and their interaction with various types of radiation. Much of the hardware involved in these techniques is dependent on a vacuum environment, so a full chapter is devoted to this topic. Characterization techniques are then divided on the basis of the interrogating radiation, with separate chapters dealing with optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy. Within each chapter, material is given covering the radiation sources, the construction and layout of instrumentation and the analysis of data. Comprehensively revised throughout, this edition reflects the rapid changes that have taken place recently. It contains additional material on a range of methods, including scanning probe techniques that reflect the need for analysis of materials at the nanoscale, and a detailed review of recent developments in data analysis and computing techniques. Physical Methods for Materials Characterisation, Second Edition will be of interest to advanced undergraduates, postgraduates, and researchers in physics, materials science, and engineering.
目录

材料表征的物理方法（Physical methods for materials characterisation）-1

材料表征的物理方法（Physical methods for materials characterisation）-2

回复此楼

» 本帖附件资源列表

欢迎监督和反馈：小木虫仅提供交流平台，不对该内容负责。
本内容由用户自主发布，如果其内容涉及到知识产权问题，其责任在于用户本人，如对版权有异议，请联系邮箱：xiaomuchong@tal.com
附件 1 : Physical_methods_for_materials_characterisation.pdf

2015-01-02 08:53:55, 9.58 M