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2Â¥2013-05-06 18:13:37
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4Â¥2013-05-09 16:39:36
hookhans
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| in order to determine the composition and chemical states of the interface, the depth of the interfacial layer has to be within the XPS detectable limitation R =3¦Ësin¦Á,[11] where ¦Ë is the inelastic mean-free paths (IMFPs) of (for) photoelectrons and ¦Á is the takeoff angle of photoelectrons respect to the sample's surface plane. The IMFPs can be calculated according to the reports of Tanuma et al.[12] In the case that the Al K¦Á is used as the radiation source, the IMFPs for Fe 2p in Fe, Ni 2p in Ni and Mg 1s in Mg are 1.34, 1.07 and 0.81 nm, respectively. |

5Â¥2013-05-10 11:23:10
hookhans
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6Â¥2013-05-10 15:41:45














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