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柠檬树

新虫 (著名写手)

[求助] 帮我改编一句话啊,换种表达

这句话是介绍测试方法的,这句话我在已经投的文章里用过了
现在在写另外的一篇文章,为了避免抄袭
想改编一些,但句子的意思不变
谢谢
To detect the composition and chemical states at the interface, the interfacial layer has to be within the XPS detectable sampling depth R =3λsinα,[11] where λ and α are inelastic mean-free paths (IMFPs) for photoelectrons and a takeoff angle for photoelectrons with respect to the samples surface plane, respectively. The IMFPs can be obtained by using the table compiled by Tanuma et al.[12] For an Al Kα radiation source, the IMFPs for Fe 2p in Fe, for Ni 2p in Ni and for Mg 1s in Mg are 1.34, 1.07 and 0.81 nm, respectively.
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372541489

铁虫 (小有名气)

【答案】应助回帖

我的博士老师说在英文中最好使用被动语态,这样的文章比较符合国外的表达方式!你试试看

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2楼2013-05-06 18:13:37
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柠檬树

新虫 (著名写手)

继续球助
3楼2013-05-08 21:21:40
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柠檬树

新虫 (著名写手)

求助什么的愈发的难了
4楼2013-05-09 16:39:36
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hookhans

铁杆木虫 (著名写手)

Farmer

【答案】应助回帖

★ ★ ★ ★ ★ ★ ★ ★ ★ ★
柠檬树: 金币+10, 翻译EPI+1, ★★★★★最佳答案, 谢谢 你对我帮助太大了,都觉得可以把你写进毕业论文啦 2013-05-10 14:43:50
in order to determine the composition and chemical states of the interface, the depth of the interfacial layer has to be within the XPS detectable limitation R =3λsinα,[11] where λ is the inelastic mean-free paths (IMFPs) of (for) photoelectrons and α is the takeoff angle of photoelectrons respect to the sample's surface plane. The IMFPs can be calculated according to the reports of Tanuma et al.[12] In the case that the Al Kα is used as the radiation source, the IMFPs for Fe 2p in Fe, Ni 2p in Ni and Mg 1s in Mg are 1.34, 1.07 and 0.81 nm, respectively.
where-there-is-a-will-there-is-a-way.
5楼2013-05-10 11:23:10
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hookhans

铁杆木虫 (著名写手)

Farmer

引用回帖:
5楼: Originally posted by hookhans at 2013-05-10 11:23:10
in order to determine the composition and chemical states of the interface, the depth of the interfacial layer has to be within the XPS detectable limitation R =3λsinα, where λ is the inelastic me ...

I am used to be a supervisor for doing so.
where-there-is-a-will-there-is-a-way.
6楼2013-05-10 15:41:45
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