CyRhmU.jpeg
²é¿´: 1585  |  »Ø¸´: 4
µ±Ç°Ö»ÏÔʾÂú×ãÖ¸¶¨Ìõ¼þµÄ»ØÌû£¬µã»÷ÕâÀï²é¿´±¾»°ÌâµÄËùÓлØÌû

Frank18711

ľ³æ (ÕýʽдÊÖ)


[½»Á÷] ¡¾ÌÖÂÛ¡¿ÇëÎʸ÷λ´óÏÀ£º¹ØÓÚ¹¦º¯Êý²âÊÔÓкÎÓÐЧ°ì·¨£¿Çë²»ÁߴͽÌ

¸÷λ´óÏÀ£¬Ò»°ã²ÉÓÃUPSºÍ¿ª¶ûÎÄ̽Õ빦º¯Êý²âÊÔ£¬ÇëÎÊ´ó¼ÒÓÐûÓÐÅöµ½²âÊÔ½á¹ûÓëÌå²ÄÁÏ£¨»òÒ»°ã±¨µÀ½á¹û£©Ïà²îÉõ´ó£¿
    Ó°Ï칦º¯ÊýµÄÒ»°ãÒòËØÓÐÄÄЩ£¿¹ØÓÚ°ëµ¼ÌåUPS½á¹û·ÖÎöÊÇ·ñÓÐÉîÈëÑо¿ÎÄÏ×»òÀíÂÛ¡£
    ¸÷λ´óÏÀ£¬²»Áߴͽ̣¬Ð»Ð»£¡

[ Last edited by Frank18711 on 2011-4-3 at 10:07 ]
»Ø¸´´ËÂ¥

» ²ÂÄãϲ»¶

» ±¾Ö÷ÌâÏà¹ØÉ̼ÒÍÆ¼ö: (ÎÒÒ²ÒªÔÚÕâÀïÍÆ¹ã)

» ±¾Ö÷ÌâÏà¹Ø¼ÛÖµÌùÍÆ¼ö£¬¶ÔÄúͬÑùÓаïÖú:

» ÇÀ½ð±ÒÀ²£¡»ØÌû¾Í¿ÉÒԵõ½:

²é¿´È«²¿É¢½ðÌù

ÒÑÔÄ   »Ø¸´´ËÂ¥   ¹Ø×¢TA ¸øTA·¢ÏûÏ¢ ËÍTAºì»¨ TAµÄ»ØÌû

donkeypku

ÖÁ×ðľ³æ (ÖøÃûдÊÖ)


Frank18711(½ð±Ò+3): Thank you for giving me so much information 2011-04-03 10:08:47
ÒýÓûØÌû:
Originally posted by Frank18711 at 2011-04-02 19:51:02:
¸÷λ´óÏÀ£¬Ò»°ã²ÉÓÃUPSºÍ¿ª¶ûÎÄ̽Õ빦º¯Êý²âÊÔ£¬ÇëÎÊ´ó¼ÒÓÐûÓÐÅöµ½²âÊÔ½á¹ûÓëÌå²ÄÁÏ£¨»òÒ»°ã±¨µÀ½á¹û£©Ïà²îÉõ´ó£¿
    Ó°Ï칦º¯ÊýµÄÒ»°ãÒòËØÓÐÄÄЩ£¿¹ØÓÚ°ëµ¼ÌåUPS½á¹û·ÖÎöÊÇ·ñÓÐÉîÈëÑо¿ÎÄÏ×»òÀíÂÛ¡£
    ¸÷λ ...

Many techniques have been developed based on different physical effects to measure the electronic work function of a sample. They can be classified into two groups: the absolute method and relative method.

Absolute electron emission method£º
Photoemission
Thermionic emission
Field electron emission
Electron tunneling (STM)

Relative contact potential difference method£º
Kelvin probe force microscope. It is not a good method because of limited success (potential ¡°drifting,¡± no absolute reference, lack of sensitivity).
4Â¥2011-04-03 09:54:42
ÒÑÔÄ   »Ø¸´´ËÂ¥   ¹Ø×¢TA ¸øTA·¢ÏûÏ¢ ËÍTAºì»¨ TAµÄ»ØÌû
Ïà¹Ø°æ¿éÌø×ª ÎÒÒª¶©ÔÄÂ¥Ö÷ Frank18711 µÄÖ÷Ìâ¸üÐÂ
ÐÅÏ¢Ìáʾ
ÇëÌî´¦ÀíÒâ¼û