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[资源] 【讲义】光学检测及设备（亚利桑那大学）

亚利桑那大学拥有世界上最优秀的光学研究中心，在国际上拥有一流的声誉，其中Lunar and Planetary 实验室的规模是世界上所有大学中最大的。James C. Wyant编写的光学检测教材集知识性和权威性与一体。

TABLE OF CONTENTS
1. Measurement of Paraxial Properties of Optical Systems
1.1 Thin Lenses
1.1.1 Measurements Based on Image Equation
1.1.2 Autocollimation Technique
1.1.3 Geneva Gauge
1.1.4 Neutralization Test
1.1.5 Focometer
1.2 Thick Lenses
1.2.1 Focal Collimator
1.2.2 Reciprocal Magnification
1.2.3 Nodal-Slide Lens Bench
2. Qualification of Optical Material
2.1 Internal Defects
2.2 Measurement of Refractive Index
2.2.1 Spectrometer
2.2.1.1 Basic Spectrometer Technique
2.2.1.2 Autocollimating Goniometer
2.2.1.3 Hilger Chance Refractometer
2.2.2 Critical Angle Systems
2.2.2.1 Abbe Refractometer
2.2.2.2 Pulfrich Refractometer
2.2.3 Ellipsometry
2.3 Strain
2.4 Mechanical and Thermal Properties
3. Aberrations
3.1 Sign Conventions
3.2 Aberration Free Image
3.3 Spherical Wavefront, Defocus, and Lateral Shift
3.4 Angular, Transverse, and Longitudinal Aberration
3.5 Seidel Aberrations
3.5.1 Spherical Aberration
3.5.2 Coma
3.5.3 Astigmatism
3.5.4 Field Curvature
3.5.5 Distortion
3.6 Zernike Polynomials
3.7 Relationship between Zernike Polynomials and Third-Order
Aberrations
3.8 Peak-Valley and RMS Wavefront Aberration
3.9 Strehl Ratio
3.10 Chromatic Aberrations
3.11 Aberrations Introduced by Plane Parallel Plates
3.12 Aberrations of Simple Thin Lenses
3.13 Conics
3.13.1 Basic Properties
3.13.2 Spherical Aberration
3.13.3 Coma
3.13.4 Astigmatism
3.14 General Aspheres
4. Basic Interferometry and Optical Testing
4.1 Two Beam Interference
4.2 Fizeau Interferometer
4.3 Twyman-Green Interferometer
4.4 Laser Based Fizeau
4.5 Mach-Zehnder Interferometer
4.6 Typical Interferograms
4.7 Interferograms and Moiré Patterns
4.8 Classical techniques for inputting data into computer
5. Direct-Phase Measurement Interferometry
5.1 Phase shifters
5.2 Zero-Crossing Technique
5.3 Phase-Lock Interferometry
5.4 Up-Down Counters
5.5 Phase-Stepping and Phase-Shifting (Integrated Bucket)
5.5.1 Algorithms
5.5.2 Phase-Unwrapping
5.5.3 Phase Shifter Calibration
5.5.4 Error due to Phase Shifter and Detector Nonlinearities
5.6 Spatial Synchronous and Fourier Methods
5.7 Spatial Carrier Phase Shifting
5.8 Vertical Scanning (Coherence Probe) Techniques
6. Measurement of Surface Quality
6.1 View transmitted or reflected light
6.2 Mechanical Probe
6.3 AFM
6.4 Lyot Test
6.5 FECO
6.6 Nomarski Interferometer
6.7 Sommargren Profiler
6.8 Interference Microscope
7. Testing Flat Surface Optical Components
7.1 Mirrors
7.1.1 Fizeau Interferometer
7.1.2 Twyman-Green Interferometer
7.1.3 Ritchey-Common Test
7.1.4 Naked Eye Test
7.2 Windows
7.2.1 Interferometer
7.2.2 Autocollimator
7.3 Prisms
7.3.1 Interferometer
7.3.2 Goniometer
7.3.3 Autocollimator
7.3.4 Naked Eye Tests
7.4 Corner Cubes
7.5 Diffraction Gratings
7.6 Index inhomogeneity
8. Testing of Curved Surfaces and/or Lenses
8.1 Radius of Curvature
8.1.1 Spherometer
8.1.2 Autostigmatic Measurement
8.1.3 Newton's Rings
8.1.4 Interferometer and Radius Slide
8.2 Surface Figure
8.2.1 Test Plate
8.2.2 Twyman-Green Interferometer (LUPI)
8.2.3 Fizeau (Laser source)
8.2.4 Spherical Wave Multiple Beam Interferometer (SWIM)
8.2.5 Shack Cube Interferometer
8.2.6 Scatterplate Interferometer
8.2.7 Smartt Point Diffraction Interferometer
8.2.8 Sommargren Diffraction Interferometer
8.2.9 Measurement of Cylindrical Surfaces
8.2.10 Star Test
8.2.11 Shack-Hartmann Test
8.2.12 Foucault Test
8.2.13 Wire Test
8.2.14 Ronchi Test
8.2.15 Lateral Shear Test
8.2.16 Radial Shear Test
9. Special Interferometric Tests for Aspherical Surfaces
9.1 Description of aspheric surfaces
9.2 Null Test
9.2.1 Conventional null optics
9.2.2 Holographic null optics
9.2.3 Computer generated holograms
9.3 Non-Null Test
9.3.1 Lateral Shear Interferometry
9.3.2 Radial Shear Interferometry
9.3.3 High-density detector arrays
9.3.4 Sub-Nyquist Interferometry
9.3.5 Long-Wavelength Interferometry
9.3.6 Two-Wavelength Holography
9.3.7 Two-Wavelength Interferometry
9.3.8 Moiré Interferometry
10. Absolute Measurements
10.1 Flat Surfaces
10.2 Spherical Surfaces
10.3 Surface Roughness
11. System Evaluation
11.1 Resolution Tests
11.2 Veiling Glare
11.3 Spread Function Measurement
11.4 Encircled Energy Measurement
11.5 Optical Transfer Function Measurement
11.5.1 Scanning Methods
11.5.2 Interferogram Analysis
11.5.3 Autocorrelation Method

[ Last edited by eurekayan on 2012-7-11 at 09:18 ]

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