24小时热门版块排行榜

返回列表

Eve-pan

银虫 (小有名气)

应助: 0 (幼儿园)
金币: 689.4
帖子: 210
在线: 84.9小时
虫号: 918072

[交流] 【求助】急！！XPS(X射线光电子能谱分析)怎么制样？

XPS(X射线光电子能谱分析)怎么制样？是不是能测元素，如P，N，S ，Cr等。
若想测出这些元素有没有其他测试手段？
我的样是在纳米球表面包裹了一层聚合物，我测了EDS，P和Cr测不出来

回复此楼

» 收录本帖的淘帖专辑推荐

XPS专区

» 猜你喜欢

» 本主题相关商家推荐: (我也要在这里推广)

» 本主题相关价值贴推荐，对您同样有帮助:

1楼 2010-11-25 13:02:46

已阅回复此楼关注TA 给TA发消息送TA红花 TA的回帖

swallowll

金虫 (正式写手)

应助: 0 (幼儿园)
金币: 759.9
帖子: 659
在线: 99.8小时
虫号: 569373

Eve-pan(金币+5):谢谢！ 2010-11-25 20:53:05

XPS只能测样品深度达 50-70 Angstroms。不知LZ你的包裹层有多厚，是否可测到里面。
XPS,EDS 一般都是表面分析的。若你想测是否含某些元素，我觉得可用元素分析吧，
原子吸收类的应该也可以
X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS can be utilized for sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth. XPS is an elemental analysis technique that is unique in providing chemical state information of the detected elements, such as distinguishing between sulfate and sulfide forms of the element sulfur. The process works by irradiating a sample with monochromatic x-rays, resulting in the emission of photoelectrons whose energies are characteristic of the elements within the sampling volume.