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Eve-pan

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[交流] 【求助】急！！XPS(X射线光电子能谱分析)怎么制样？

XPS(X射线光电子能谱分析)怎么制样？是不是能测元素，如P，N，S ，Cr等。
若想测出这些元素有没有其他测试手段？
我的样是在纳米球表面包裹了一层聚合物，我测了EDS，P和Cr测不出来

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1楼2010-11-25 13:02:46

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swallowll

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Eve-pan(金币+5):谢谢！ 2010-11-25 20:53:05

XPS只能测样品深度达 50-70 Angstroms。不知LZ你的包裹层有多厚，是否可测到里面。
XPS,EDS 一般都是表面分析的。若你想测是否含某些元素，我觉得可用元素分析吧，
原子吸收类的应该也可以
X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS can be utilized for sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth. XPS is an elemental analysis technique that is unique in providing chemical state information of the detected elements, such as distinguishing between sulfate and sulfide forms of the element sulfur. The process works by irradiating a sample with monochromatic x-rays, resulting in the emission of photoelectrons whose energies are characteristic of the elements within the sampling volume.