| ²é¿´: 1041 | »Ø¸´: 3 | |||
| ±¾Ìû²úÉú 1 ¸ö ²©Ñ§EPI £¬µã»÷ÕâÀï½øÐв鿴 | |||
344840772гæ (СÓÐÃûÆø)
|
[½»Á÷]
ÇóһƪÎÄÕµÄEIÊÕ¼ºÅ ¼± ¼± ллÀ²
|
||
|
ÎÄÕÂÃû£ºX-ray residual stress analysis in different thickness TiN coatings on high-speed-steel substrates ÇóEIÊÕ¼ºÅ |
» ²ÂÄãϲ»¶
ÌåÖÆÄÚ³¤±²ËµÌåÖÆÄÚ¾ø´ó²¿·ÖÒ»±²×ÓÔڵײ㣬ÈçͬÄãÃÇÒ»Ñù´ó²¿·ÖÆÕͨ½ÌʦæÇÒÊÕÈëµÍ
ÒѾÓÐ13È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ7È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ8È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ8È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ11È˻ظ´
ΪʲôÖйú´óѧ¹¤¿Æ½ÌÊÚÃÇË®ÁËÄÇô¶àËùνµÄ¶¥»á¶¥¿¯£¬µ«»¹ÊÇ×ö²»³öÓîÊ÷»úÆ÷ÈË£¿
ÒѾÓÐ8È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ5È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ6È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ9È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8 O5 51O 54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ4È˻ظ´
ganchunlei
ÖÁ×ðľ³æ (ÖøÃûдÊÖ)
- ²©Ñ§EPI: 166
- Ó¦Öú: 0 (Ó×¶ùÔ°)
- ¹ó±ö: 2.296
- ½ð±Ò: 12591.6
- É¢½ð: 514
- ºì»¨: 8
- ɳ·¢: 2
- Ìû×Ó: 2353
- ÔÚÏß: 1469.4Сʱ
- ³æºÅ: 257983
- ×¢²á: 2006-06-10
- ÐÔ±ð: MM
- רҵ: Óлú·ÖÎö
344840772(½ð±Ò+4, ²©Ñ§EPI+1): 2010-08-30 09:25:27
|
Accession number: 20102813067791 Title: X-ray residual stress analysis in different thickness TiN coatings on high-speed-steel substrates Authors: Gong, Man-Feng1, 2 ; Qiao, Sheng-Ru1 ; Lu, Guo-Feng1 ; Ji, Hao1 Author affiliation: 1 National Key Laboratory of Thermostructure Composite Materials, Northwestern Polytechnical University, Xi'an 710072, China 2 Dept. of Mechano-electronic, Zhanjiang Normal University, Guangdong 524048, China Corresponding author: Gong, M.-F. (gongmanfeng@163.com) Source title: Cailiao Kexue yu Gongyi/Material Science and Technology Abbreviated source title: Cailiao Kexue yu Gongyi Volume: 18 Issue: 3 Issue date: June 2010 Publication year: 2010 Pages: 415-419+424 Language: Chinese ISSN: 10050299 CODEN: CKGOEY Document type: Journal article (JA) Publisher: Harbin Institute of Technology, P.O. Box 136, Harbin, 150001, China Abstract: Multi-arc ion plating technique has been used to deposite hard TiN coatings on AISI M2 high-speed-steel (HSS) substrates. The thickness of the substrate was 1.0 mm in all the samples, while five thicknesses of the TiN coatings, respectively, 3.0, 5.0, 7.0, 9.0 and 11.0 ¦Ìm were used. X-ray diffraction (XRD) has been used for measuring residual stress on TiN coatings. The stresses along five different directions (¦·=0¡ã, 20.7¡ã, 30¡ã, 37.8¡ã and 45¡ã) on the coating surface have been measured by recording the peak positions of TiN (220) reflection for each 2¦È at different tilt angles ¦·. Regardless of the thickness change of TiN coatings employed on substrate, residual compressive stresses are present in the TiN layers. Furthermore, the results reveal the residual stresses in the TiN layers are high. While the coatings thickness changed from3¦Ìm to 11¦Ìm, the residual stresses in the TiN coatings varied from-3.22 to-2.04GPa, the intrinsic stresses varied from-1.32 to-0.14GPa, the thermal stresses varied from-1.86 to-1.75GPa. The residual stresses in TiN coatings shew a nonlinear change with the increasing coatings thickness. When the coatings thickness was about 8.5¦Ìm, the residual stresses in TiN coatings reached to the maximum by fitting polynomial. These changes ascribes to the defects in the TiN coatings, such as the micro-holes, cooling liquid drops and micro-cracks near the interface between the coating and the substrate, increase with the increasing TiN coatings thickness, which leads the residual stresses in TiN coatings to release effectively. Number of references: 16 Main heading: Hard coatings Controlled terms: Cracks - Ion implantation - Residual stresses - Stress analysis - Substrates - Titanium nitride - X ray diffraction Uncontrolled terms: AISI M2 - Coating surface - Cooling liquid - Different thickness - High speed steel substrate - Intrinsic stress - Micro holes - Multiarc ion plating - Nonlinear changes - Peak position - Residual compressive stress - Tilt angle - TiN coating - TiN layers - X-ray residual stress - XRD Classification code: 951 Materials Science - 933.1.1 Crystal Lattice - 932.1 High Energy Physics - 931.3 Atomic and Molecular Physics - 813.1 Coating Techniques - 813 Coatings and Finishes - 812.2 Refractories - 804.2 Inorganic Compounds - 801 Chemistry - 714.2 Semiconductor Devices and Integrated Circuits - 712.1 Semiconducting Materials - 461 Bioengineering and Biology - 421 Strength of Building Materials; Mechanical Properties Database: Compendex |

2Â¥2010-08-29 18:07:24
315050870lk
¾èÖú¹ó±ö (СÓÐÃûÆø)
- Ó¦Öú: 0 (Ó×¶ùÔ°)
- ½ð±Ò: 78.6
- É¢½ð: 115
- ºì»¨: 1
- Ìû×Ó: 246
- ÔÚÏß: 211.3Сʱ
- ³æºÅ: 917333
- ×¢²á: 2009-12-01
- רҵ: Äý¾Û̬ÎïÐÔ II £ºµç×ӽṹ
3Â¥2010-08-29 22:41:03
yfx2003
½ð³æ (ÖøÃûдÊÖ)
- Ó¦Öú: 7 (Ó×¶ùÔ°)
- ½ð±Ò: 1434.3
- ºì»¨: 4
- Ìû×Ó: 1777
- ÔÚÏß: 62.9Сʱ
- ³æºÅ: 1037371
- ×¢²á: 2010-06-07
- רҵ: ¼ÆËã»ú¿ÆÑ§µÄ»ù´¡ÀíÂÛ

4Â¥2010-08-30 07:49:31













»Ø¸´´ËÂ¥