| 查看: 1000 | 回复: 3 | |||
| 本帖产生 1 个 博学EPI ,点击这里进行查看 | |||
| 当前只显示满足指定条件的回帖,点击这里查看本话题的所有回帖 | |||
[交流]
求一篇文章的EI收录号 急 急 谢谢啦
|
|||
|
文章名:X-ray residual stress analysis in different thickness TiN coatings on high-speed-steel substrates 求EI收录号 |
» 猜你喜欢
博士读完未来一定会好吗
已经有21人回复
导师想让我从独立一作变成了共一第一
已经有5人回复
到新单位后,换了新的研究方向,没有团队,持续积累2区以上论文,能申请到面上吗
已经有11人回复
读博
已经有4人回复
JMPT 期刊投稿流程
已经有4人回复
心脉受损
已经有5人回复
Springer期刊投稿求助
已经有4人回复
小论文投稿
已经有3人回复
Bioresource Technology期刊,第一次返修的时候被退回好几次了
已经有9人回复
申请2026年博士
已经有6人回复
315050870lk
捐助贵宾 (小有名气)
- 应助: 0 (幼儿园)
- 金币: 78.6
- 散金: 115
- 红花: 1
- 帖子: 246
- 在线: 211.3小时
- 虫号: 917333
- 注册: 2009-12-01
- 专业: 凝聚态物性 II :电子结构
3楼2010-08-29 22:41:03
ganchunlei
至尊木虫 (著名写手)
- 博学EPI: 166
- 应助: 0 (幼儿园)
- 贵宾: 2.296
- 金币: 12591.6
- 散金: 514
- 红花: 8
- 沙发: 2
- 帖子: 2353
- 在线: 1469.4小时
- 虫号: 257983
- 注册: 2006-06-10
- 性别: MM
- 专业: 有机分析
344840772(金币+4, 博学EPI+1): 2010-08-30 09:25:27
|
Accession number: 20102813067791 Title: X-ray residual stress analysis in different thickness TiN coatings on high-speed-steel substrates Authors: Gong, Man-Feng1, 2 ; Qiao, Sheng-Ru1 ; Lu, Guo-Feng1 ; Ji, Hao1 Author affiliation: 1 National Key Laboratory of Thermostructure Composite Materials, Northwestern Polytechnical University, Xi'an 710072, China 2 Dept. of Mechano-electronic, Zhanjiang Normal University, Guangdong 524048, China Corresponding author: Gong, M.-F. (gongmanfeng@163.com) Source title: Cailiao Kexue yu Gongyi/Material Science and Technology Abbreviated source title: Cailiao Kexue yu Gongyi Volume: 18 Issue: 3 Issue date: June 2010 Publication year: 2010 Pages: 415-419+424 Language: Chinese ISSN: 10050299 CODEN: CKGOEY Document type: Journal article (JA) Publisher: Harbin Institute of Technology, P.O. Box 136, Harbin, 150001, China Abstract: Multi-arc ion plating technique has been used to deposite hard TiN coatings on AISI M2 high-speed-steel (HSS) substrates. The thickness of the substrate was 1.0 mm in all the samples, while five thicknesses of the TiN coatings, respectively, 3.0, 5.0, 7.0, 9.0 and 11.0 μm were used. X-ray diffraction (XRD) has been used for measuring residual stress on TiN coatings. The stresses along five different directions (Ψ=0°, 20.7°, 30°, 37.8° and 45°) on the coating surface have been measured by recording the peak positions of TiN (220) reflection for each 2θ at different tilt angles Ψ. Regardless of the thickness change of TiN coatings employed on substrate, residual compressive stresses are present in the TiN layers. Furthermore, the results reveal the residual stresses in the TiN layers are high. While the coatings thickness changed from3μm to 11μm, the residual stresses in the TiN coatings varied from-3.22 to-2.04GPa, the intrinsic stresses varied from-1.32 to-0.14GPa, the thermal stresses varied from-1.86 to-1.75GPa. The residual stresses in TiN coatings shew a nonlinear change with the increasing coatings thickness. When the coatings thickness was about 8.5μm, the residual stresses in TiN coatings reached to the maximum by fitting polynomial. These changes ascribes to the defects in the TiN coatings, such as the micro-holes, cooling liquid drops and micro-cracks near the interface between the coating and the substrate, increase with the increasing TiN coatings thickness, which leads the residual stresses in TiN coatings to release effectively. Number of references: 16 Main heading: Hard coatings Controlled terms: Cracks - Ion implantation - Residual stresses - Stress analysis - Substrates - Titanium nitride - X ray diffraction Uncontrolled terms: AISI M2 - Coating surface - Cooling liquid - Different thickness - High speed steel substrate - Intrinsic stress - Micro holes - Multiarc ion plating - Nonlinear changes - Peak position - Residual compressive stress - Tilt angle - TiN coating - TiN layers - X-ray residual stress - XRD Classification code: 951 Materials Science - 933.1.1 Crystal Lattice - 932.1 High Energy Physics - 931.3 Atomic and Molecular Physics - 813.1 Coating Techniques - 813 Coatings and Finishes - 812.2 Refractories - 804.2 Inorganic Compounds - 801 Chemistry - 714.2 Semiconductor Devices and Integrated Circuits - 712.1 Semiconducting Materials - 461 Bioengineering and Biology - 421 Strength of Building Materials; Mechanical Properties Database: Compendex |

2楼2010-08-29 18:07:24
yfx2003
金虫 (著名写手)
- 应助: 7 (幼儿园)
- 金币: 1434.3
- 红花: 4
- 帖子: 1777
- 在线: 62.9小时
- 虫号: 1037371
- 注册: 2010-06-07
- 专业: 计算机科学的基础理论

4楼2010-08-30 07:49:31













回复此楼