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To determine the orientation of the as-grown O4 single crystal, the wafers cut perpendicularly to the growth direction was tested by XRD2.. There is only one dot in the XRD2 image. Fig. 4 gives the XRD2 pattern integrated from the XRD2 image, and the peak at 42.7° can be indexed to (400) plane. It means that the O4 single crystals grow along the a-axis direction. According to the phase diagram of 2 system, nostoichiometric will result in the appearance of mixture of Zn2TiO4 and ZnO or ZnTiO3. Due to there is no Z1 or Z2 in XRD and Raman, the component of the as-grown crystal is homogeneous. 最好把修改的地方标出来 万分感谢 |
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| As to determine the orientation of the as-grown O4 single crystal, the wafers cut perpendicularly to the growth direction was tested by XRD2.. There is only one dot in the XRD2 image. Fig. 4 gives the XRD2 pattern integrated from the XRD2 image, and the peak at 42.7° can be indexed to (400) plane. It means that the O4 single crystals grow along the a-axis direction. According to the phase diagram of 2 system, nostoichiometric will result in the appearance of mixture of Zn2TiO4 and ZnO or ZnTiO3. Due to there is no Z1 or Z2 in XRD and Raman, the component of the as-grown crystal is homogeneous. |

3楼2010-04-07 15:20:09
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sirljz(金币+1):谢谢交流 2010-04-07 08:58
lliang921(金币+15, 翻译EPI+1): 2010-04-09 08:55
sirljz(金币+1):谢谢交流 2010-04-07 08:58
lliang921(金币+15, 翻译EPI+1): 2010-04-09 08:55
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To determine the CRYSTAL GROWTH orientation of the as-grown O4 single crystal, the wafers WERE cut IN A DIRECTION perpendicular to the CRYSTAL growth direction FOR XRD2 DETECTION. There is only one PEAK in the XRD2 image. Fig. 4 gives the XRD2 SPECTRA EXTRACTED from the XRD2 image. The peak at 42.7° REPRESENTS (400) plane.THE RESULT INDICATES that the O4 single crystals growED along the a-axis. According to the phase diagram of 2 system, nostoichiometric REACTION USUALLY result in A mixture of Zn2TiO4 and ZnO or ZnTiO3. IN ADDITION, no Z1 or Z2 WERE DETERMINED BY XRD and Raman. THEREFORE, IT IS SAFE TO CONCLUDE THAT the as-grown crystalS HAD A homogeneous STRUCTURE. P.S. 删除的部分没有标记出来。 |
2楼2010-04-07 05:45:20
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To determine the orientation of ZO single crystal growth, the wafers located at the middle and top of the crystal rod were cut in a direction perpendicular to the crystal growth direction for XRD examination. Results were same at middle and top of the rod. There was only one dot in the XRD image. Fig. 4 illustrated the XRD2 pattern extracted from the XRD2 image. The peak at 42.7° was the reflection of (400) plane. The result indicated that the ZO single crystals growed uniformly along the a-axis. P.S. 删除的部分没有标记出来。 转载:http://muchong.com/bbs/viewthread.php?tid=1932281&fpage=1 |
4楼2010-04-07 16:52:01













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