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ll921木虫 (正式写手)
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| To determine the orientation of the as-grown ZO single crystal, the wafers located at the middle and top of crystal rod cut perpendicularly to the growth direction was tested by XRD2. Obtained results are the same. There is only one dot in the XRD2 image. Fig. 4 gives the XRD2 pattern integrated from the XRD2 image, and the peak at 42.7° can be indexed to (400) plane. It means that the ZO single crystals grow uniformly along the a-axis direction. |
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sirljz(金币+2, 翻译EPI+1):谢谢交流 2010-04-06 09:44
ll921(金币+10): 2010-04-09 08:52
sirljz(金币+2, 翻译EPI+1):谢谢交流 2010-04-06 09:44
ll921(金币+10): 2010-04-09 08:52
| To determine the orientation of ZO single crystal growth, the wafers located at the middle and top of the crystal rod were cut in a direction perpendicular to the crystal growth direction for XRD examination. Results were same at middle and top of the rod. There was only one dot in the XRD image. Fig. 4 illustrated the XRD2 pattern extracted from the XRD2 image. The peak at 42.7° was the reflection of (400) plane. The result indicated that the ZO single crystals growed uniformly along the a-axis. |
2楼2010-04-05 17:45:46
sammi_deng
金虫 (正式写手)
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| To determine the orientation of the growth ZO single crystal, the wafers located at the middle and top of crystal rod cut in the direction of growth perpendicularly were tested by XRD2. The obtained results are the same. There was only one dot in the XRD2 image. Fig. 4 which showed that the XRD2 pattern was integrated from the XRD2 image, and the peak at 42.7° can be indexed to (400) plane. The result indicates that the ZO single crystals grow uniformly along the direction of a-axis . |
3楼2010-04-06 12:54:28
