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sirljz(金币+2, 翻译EPI+1):谢谢交流 2010-04-06 09:44
ll921(金币+10): 2010-04-09 08:52
To determine the orientation of ZO single crystal growth, the wafers located at the middle and top of the crystal rod were cut in a direction perpendicular to the crystal growth direction for XRD examination. Results were same at middle and top of the rod. There was only one dot in the XRD image. Fig. 4 illustrated the XRD2 pattern extracted from the XRD2 image. The peak at 42.7° was the reflection of (400) plane. The result indicated that the ZO single crystals growed uniformly along the a-axis.
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