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1、PET薄膜处理前后表面微观形貌采用日本JEOL公司的JSM-5900型电子扫描显微镜，经过镀金预处理之后，采用放大倍数5000×进行观测； 2、表面化学成分通过美国Nicolet 公司的Nexus 670型傅里叶红外光谱仪进行分析，仪器的分辨率为0.1cm-1。测试时，将样本放入扫描仓中，使用60次/秒采样速度，记录扫描范围在4000~600cm-1的光谱。 |
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charleygan 
至尊木虫 (著名写手)
chlgan
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1、The micro-morphology of PET film, which is pretreated by plating gold, is observed with SEM, 5000x, JSM-5900, JEOL Co., Japan. 2、Surface chemical components are determined with FTIR, Nexus 670, Sensibility 0.1cm-1, Nicolet Co., USA. Load the sample in the sample cell and record the spectrum ranged from 4000 to 600cm-1 at sampling speed of 60 per second. |
2楼2009-10-19 15:21:38
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yhison0614(金币+8,VIP+0): 10-21 21:03
yhison0614(金币+8,VIP+0): 10-21 21:03
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1, PET film surface topography before and after treatment using the company's Japanese JEOL model JSM-5900 scanning electron microscope, after gold-plated, after pretreatment, using 5000 × magnification to observe; 2, the surface chemical composition of the company through the United States Nicolet Model Nexus 670 Fourier transform infrared spectrometer for analysis, instrument has a resolution of 0.1cm-1. Test, a sample is scanned into the warehouse, the use of 60 times / second sampling rate, record scanning range of 4000 ~ 600cm-1 of the spectrum. |
3楼2009-10-19 16:05:53
含笑天天
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看看这个怎么样
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yhison0614(金币+2,VIP+0): 10-21 21:04
yhison0614(金币+2,VIP+0): 10-21 21:04
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1, Effect of treatment on PET membrane surface micro-morphology was examined by JSM-5900 scanning electron microscope (JEOL company, Japan), observed at 5000× after plated pretreatment. 2, The surface chemical composition was analyzed using Nexus 670 Fourier Transform Infrared Spectrometer (Nicolet company, USA), with a resolution of 0.1cm-1, sampling rate: 60 times / s, scanning spectrum range: 400 ~ 600cm-1. |
4楼2009-10-19 19:47:25
1. The topographies of PET thin films
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yhison0614(金币+10,VIP+0):第二段不错 10-21 21:02
yhison0614(金币+10,VIP+0):第二段不错 10-21 21:02
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before and after treatments were first thinly coated with Au and then observed using a SEM (Model JSM5900 of JEOL, Japan) at 5000x. 2. The surface compositions of the films were analyzed using a FT-IR spectrometer (Nexus 670 of Ncolet, USA) with a resolution of 0.1 cm-1. During measurements, each sample would first be loaded into the scan chamber and its FT-IR spectrum was subsequently recorded in a wave number range from 400 to 600 cm-1 and at a sampling rate of 60/s. |
5楼2009-10-20 15:19:22
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