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materialsci

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[求助] 麻烦帮忙查文章是否被检索？

哪位好友能帮我查一下文章“Progress in Natural Science: Materials International 26 (2016) 163–168”是否被web of science检索，如果检索了，帮我把检索网页抓图发一下，多谢！添麻烦了
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1楼 2016-09-01 13:13:01
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lazy锦溪: LS-EPI+1 2016-09-01 14:13:27
https://apps.webofknowledge.com/ ... age=1&doc=7
In-situ potential mapping of space charge layer in GaN nanowires under electrical field by off-axis electron holography
作者:Chen, X (Chen, Xiao)[ 1,2 ] ; Wang, YG (Wang, Yanguo)[ 2 ] ; Guo, J (Guo, Jie)[ 3 ] ; Jian, JK (Jian, Jikang)[ 3 ] ; Gu, L (Gu, Lin)[ 2,4 ] ; Zhang, ZH (Zhang, Zhihua)[ 1 ]


PROGRESS IN NATURAL SCIENCE-MATERIALS INTERNATIONAL


卷: 26
期: 2
页: 163-168
DOI: 10.1016/j.pnsc.2016.03.009

出版年: APR 2016

查看期刊信息

PROGRESS IN NATURAL SCIENCE-MATERIALS INTERNATIONAL  

出版商 ELSEVIER SCIENCE INC, 360 PARK AVE SOUTH, NEW YORK, NY 10010-1710 USA

ISSN: 1002-0071
eISSN: 1745-5391

研究领域 Materials Science
Science & Technology - Other Topics



摘要
In situ potential mapping of space charge (SC) layer in a single GaN nanowire (NW) contacted to the Au metal electrode has been conducted using off-axis electron holography in order to study the space distribution of SC layer under electric biases. Based on the phase image reconstructed from the complex hologram the electrostatic potential at the SC layer was clearly revealed; the SC width was estimated to be about 76 nm under zero bias condition. In order to study dynamic interrelation between the SC layer and bias conditions, the variation of the electrostatic potential due to change of the SC widths respond to the different bias conditions have also been examined. The measured SC layers are found to vary between 68 nm and 91 nm, which correspond to the saturated SC layers at the GaN-Au contact under the forward and reverse bias conditions, respectively. By plotting the square widths of the SC layer against the applied voltages, donor density of GaN NWs was derived to be about 4.3*10(6) cm(-3). Our experiments demonstrate that in-situ electron holography under electric field can be a useful method to investigate SC layers and donor density in single NW and other heterostructures. (C) 2016 Chinese Materials Research Society. Production and hosting by Elsevier B.V.

关键词
作者关键词:Space charge layer; Electron holography; In-situ TEM; Semiconductor nanowire; Semiconductor-metal contact

KeyWords Plus:CAPACITANCE; DIODES; SCALE

作者信息
通讯作者地址: Zhang, ZH (通讯作者) Dalian Jiaotong Univ, Liaoning Key Mat Lab Railway, Dalian 116028, Peoples R China.
  增强组织信息的名称
    Dalian Jiaotong University  
通讯作者地址: Wang, YG (通讯作者) Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China.
  增强组织信息的名称
    Chinese Academy of Sciences  


地址:  [ 1 ] Dalian Jiaotong Univ, Liaoning Key Mat Lab Railway, Dalian 116028, Peoples R China
  增强组织信息的名称
    Dalian Jiaotong University  
[ 2 ] Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China
  增强组织信息的名称
    Chinese Academy of Sciences  
[ 3 ] Xinjiang Univ, Sch Phys Sci & Technol, Urumqi 830046, Peoples R China
  增强组织信息的名称
    Xinjiang University  
       [ 4 ] Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China


电子邮件地址:ygwang@blcm.ac.cn; zhzhang@djtu.edu.cn

基金资助致谢
基金资助机构 授权号
Major State Basic Research Development Program of China  2014CB921002
2012CB921702  
National Natural Science Foundation of China  11274365
51372027
51172193  
Strategic Priority Research Program of the Chinese Academy of Sciences  XDB07030200  
查看基金资助信息关闭基金资助信息   

This work is supported by the Major State Basic Research Development Program of China under Contract nos. 2014CB921002 and 2012CB921702, the National Natural Science Foundation of China (Grant nos. 11274365, 51372027 and 51172193), and the Strategic Priority Research Program of the Chinese Academy of Sciences under Grant no. XDB07030200.

出版商
ELSEVIER SCIENCE INC, 360 PARK AVE SOUTH, NEW YORK, NY 10010-1710 USA

类别 / 分类
研究方向:Materials Science; Science & Technology - Other Topics

Web of Science 类别:Materials Science, Multidisciplinary; Multidisciplinary Sciences

文献信息
文献类型:Article

语种:English

入藏号: WOS:000375607000007

ISSN: 1002-0071

eISSN: 1745-5391

其他信息
IDS 号: DL4LG

Web of Science 核心合集中的 "引用的参考文献": 18

Web of Science 核心合集中的 "被引频次": 0

JCR® 类别 JCR 分区
MATERIALS SCIENCE, MULTIDISCIPLINARY  Q2


数据来自第 2015 版 Journal Citation Reports®
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2楼2016-09-01 13:17:52
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materialsci

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引用回帖:
2楼: Originally posted by baiyuefei at 2016-09-01 13:17:52
https://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=1&SID=3ArE6PW2HfNbUUETSRk&page=1&doc=7
In-situ potential mapping of space charge layer in  ...

您好，能不能帮我发送一个网页截图？谢谢，添麻烦了
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materialsci: 金币+20, ★★★★★最佳答案 2016-09-01 13:43:16
引用回帖:
3楼: Originally posted by materialsci at 2016-09-01 13:23:45
您好，能不能帮我发送一个网页截图？谢谢，添麻烦了...

https://apps.webofknowledge.com/ ... doc=7#opennewwindow
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