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[资源] 透射电镜（TEM）的消象校正分析（英文版）

Aberration-Corrected Analytical Transmission Electron Microscopy

Author(s): Susan Brooks(eds.)
Year: 2011
Language: English Pages: 297
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).Content:
Chapter 1 General Introduction to Transmission Electron Microscopy (TEM) (pages 1–19): Peter Goodhew
Chapter 2 Introduction to Electron Optics (pages 21–38): Gordon Tatlock
Chapter 3 Development of STEM (pages 39–53): L. M. Brown
Chapter 4 Lens Aberrations: Diagnosis and Correction (pages 55–87): Andrew Bleloch and Quentin Ramasse
Chapter 5 Theory and Simulations of STEM Imaging (pages 89–110): Peter D. Nellist
Chapter 6 Details of STEM (pages 111–161): Alan Craven
Chapter 7 Electron Energy Loss Spectrometry and Energy Dispersive X?ray Analysis (pages 163–210): Rik Brydson and Nicole Hondow
Chapter 8 Applications of Aberration?Corrected Scanning Transmission Electron Microscopy (pages 211–240): Mervyn D. Shannon
Chapter 9 Aberration?Corrected Imaging in CTEM (pages 241–261): Sarah J. Haigh and Angus I. Kirkland

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2014-12-11 08:02:39, 3.59 M