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关于Advanced Materials Research 检索类型!!
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哪位知道Advanced Materials Research 检索类型? 大部分都说是会议检索。 但是我偶尔看到居然有期刊检索的，求解？？？具体见下内容 XPS characterization of porphyrin based self-assembled monolayers on gold 作者: Advanced Materials Research 卷: 548 页: 235-8 DOI: 10.4028/www.scientific.net/AMR.548.234 出版年: 2012 文献信息 文献类型:Journal Paper 语种:English 入藏号:13666011 ISSN:1022-6680 参考文献数:21 |
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baiyuefei
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zch79214: 金币+3, ★★★很有帮助 2014-08-16 08:43:28
感谢参与，应助指数 +1
zch79214: 金币+3, ★★★很有帮助 2014-08-16 08:43:28
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Accession number: 20124515635291 Title: XPS characterization of porphyrin based self-assembled monolayers on gold Authors: Liu, Guangyan1 ; Wang, Wencai2 Author affiliation: 1 Binzhou Polytechnic, Shandong 256603, China 2 Key Laboratory of Carbon Fiber and Functional Polymers, Beijing 100029, China Corresponding author: Liu, G. (gyliu2@yahoo.com) Source title: Advanced Materials Research Abbreviated source title: Adv. Mater. Res. Volume: 548 Monograph title: Material and Manufacturing Technology III Issue date: 2012 Publication year: 2012 Pages: 234-238 Language: English ISSN: 10226680 ISBN-13: 9783037854532 Document type: Conference article (CA) Conference name: 3rd International Conference on Material and Manufacturing Technology, ICMMT 2012 Conference date: May 5, 2012 - May 6, 2012 Conference location: Chengdu, China Conference code: 92652 Sponsor: International Association of Computer Science; and Information Technology(IACSIT); Sichuan Institute of Electronics Publisher: Trans Tech Publications, P.O. Box 1254, Clausthal-Zellerfeld, D-38670, Germany Abstract: XPS characterization of self-assembled monolayers (SAMs) of tetraphenylporphyrin bearing a rigid tripodal linker by chemisorption of the thiol-derivatized terminal groups on gold substrate is described. The surface structure of the SAMs bearing tripodal linker were analyzed by X-ray photoelectron spectroscopy (XPS), and electrochemical cyclic voltammetry (CV) measurements. XPS confirms the formation of porphyrin SAMs on Au surface and identified bonding configurations of porphyrin molecules in the chemisorption of SAMs. The film thickness values (36 A&ring  obtained by XPS agree well with the estimated value by assuming the vertical orientation of the molecules on the gold surface. Using the Au4f7/2 as an internal standard, a lower binding energies shift (1.8 eV) of S2p in the SAMs reveals that the porphyrins were chemisorbed onto the surface via sulfur-gold bonds. Electrochemical CV measurements suggest near monolayer coverage of the tripodal porphyrins with good stability of the redox SAMs, which have promising application in the development of molecular based electronic device and memory architectures. © (2012) Trans Tech Publications, Switzerland. Number of references: 21 Main heading: X ray photoelectron spectroscopy Controlled terms: Binding energy - Chemisorption - Cyclic voltammetry - Gold - Lunar surface analysis - Manufacture - Molecules - Organic polymers - Photoelectrons - Porphyrins - Self assembled monolayers - Sulfur - Surface analysis Uncontrolled terms: Au surfaces - Bonding configurations - C-V measurement - Electronic device - Gold substrates - Gold surfaces - Good stability - Internal standards - Monolayer coverage - Porphyrin molecules - Sams - Terminal groups - Tetraphenyl porphyrins - Thickness value - XPS characterization Classification code: 951 Materials Science - 931.3 Atomic and Molecular Physics - 815.1.1 Organic Polymers - 813.2 Coating Materials - 804.1 Organic Compounds - 804 Chemical Products Generally - 802.2 Chemical Reactions - 801 Chemistry - 547.1 Precious Metals - 537.1 Heat Treatment Processes - 423 Non Mechanical Properties and Tests of Building Materials DOI: 10.4028/www.scientific.net/AMR.548.234 Database: Compendex Compilation and indexing terms, © 2014 Elsevier Inc. Full-text and Local Holdings Links |
2楼2014-08-16 08:37:51
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zch79214: 金币+3, ★★★很有帮助 2014-08-16 08:43:19
zch79214: 金币+3, ★★★很有帮助 2014-08-16 08:43:19
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Accession number: 13666011 Title: XPS characterization of porphyrin based self-assembled monolayers on gold Authors: Guangyan Liu1 ; Wencai Wang2 Author affiliation: 1 Binzhou Polytech., Binzhou, China 2 Key Lab. of Carbon Fiber & Functional Polymers, Beijing, China Source title: Advanced Materials Research Abbreviated source title: Adv. Mater. Res. (Switzerland) Volume: 548 Publication date: 2012 Pages: 235-8 Language: English ISSN: 1022-6680 Document type: Journal article (JA) Publisher: Trans Tech Publications Ltd. Country of publication: Switzerland Material Identity Number: GC91-2013-006 Abstract: XPS characterization of self-assembled monolayers (SAMs) of tetraphenylporphyrin bearing a rigid tripodal linker by chemisorption of the thiol-derivatized terminal groups on gold substrate is described. The surface structure of the SAMs bearing tripodal linker were analyzed by X-ray photoelectron spectroscopy (XPS), and electrochemical cyclic voltammetry (CV) measurements. XPS confirms the formation of porphyrin SAMs on Au surface and identified bonding configurations of porphyrin molecules in the chemisorption of SAMs. The film thickness values (36 A&ring obtained by XPS agree well with the estimated value by assuming the vertical orientation of the molecules on the gold surface. Using the Au4f7/2 as an internal standard, a lower binding energies shift (1.8 eV) of S2p in the SAMs reveals that the porphyrins were chemisorbed onto the surface via sulfur-gold bonds. Electrochemical CV measurements suggest near monolayer coverage of the tripodal porphyrins with good stability of the redox SAMs, which have promising application in the development of molecular based electronic device and memory architectures. Number of references: 21 Inspec controlled terms: binding energy - chemisorption - electrochemistry - monolayers - organic compounds - oxidation - reduction (chemical) - self-assembly - surface structure - thin films - voltammetry (chemical analysis) - X-ray photoelectron spectra Uncontrolled terms: XPS characterization - self-assembled monolayers - tetraphenylporphyrin - rigid tripodal linker - chemisorption - thiol-derivatized terminal groups - gold substrate - surface structure - X-ray photoelectron spectroscopy - XPS - electrochemical cyclic voltammetry measurements - CV measurements - porphyrin SAM formation - surface bonding configurations - porphyrin molecules - film thickness values - binding energy shift - sulfur-gold surface bonds - electrochemical CV measurements - tripodal porphyrins - redox SAM - molecular based electronic device - memory architectures - electron volt energy 1.8 eV - S-Au Inspec classification codes: A6817 Monolayers and Langmuir-Blodgett films - A6855 Thin film growth, structure, and epitaxy - A8265M Sorption and accommodation coefficients (surface chemistry) - A6845D Adsorption and desorption kinetics; evaporation and condensation - A6820 Solid surface structure - A8245 Electrochemistry and electrophoresis - A8280F Electrochemical analytical methods - A8230 Specific chemical reactions; reaction mechanisms - A8160 Corrosion, oxidation, etching, and other surface treatments - A8280P Electron spectroscopy for chemical analysis (photoelectron, Auger spectroscopy, etc.) - A7960 Photoemission and photoelectron spectra (condensed matter) Numerical data indexing: electron volt energy 1.8E+00 eV Chemical indexing: SAu/sur Au/sur S/sur SAu/bin Au/bin S/bin Treatment: Experimental (EXP) Discipline: Physics (A) DOI: 10.4028/www.scientific.net/AMR.548.234 IPC Code: G01N27/26 SECTION G PHYSICS MEASURING counting ; TESTING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES separating components of materials in general , , , ; apparatus fully provided for in a single other... Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means take precedence; measurement or testing of electric or magnetic variables or of electric or magnetic... by investigating electrochemical variables; by using electrolysis or electrophoresis investigating resistance to corrosion ; investigating or analysing materials by separation into components using... Database: Inspec Copyright 2013, The Institution of Engineering and Technology |
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