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ÂÛÎÄÌâÄ¿£ºResearch on radiometric calibration for super wide-angle staring infrared imaging system ×÷ÕߣºFuyu Huang; Xueju Shen; Jie Liu; Guang Li; Jiaju Ying À´Ô´³ö°æÎï: Infrared Physics & Technology 61(2013) 9-13 |
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Research on radiometric calibration for super wide-angle staring infrared imaging system ×÷Õß:Huang, FY (Huang, Fuyu)[ 1 ] ; Shen, XJ (Shen, Xueju)[ 1 ] ; Liu, J (Liu, Jie)[ 1 ] ; Li, G (Li, Gang)[ 1 ] ; Ying, JJ (Ying, Jiaju)[ 1 ] INFRARED PHYSICS & TECHNOLOGY ¾í: 61 Ò³: 9-13 DOI: 10.1016/j.infrared.2013.06.012 ³ö°æÄê: NOV 2013 ²é¿´ÆÚ¿¯ÐÅÏ¢ ÕªÒª To perform radiometric calibration on super wide-angle staring infrared imaging system, the calibration experiment is carried out by using a standard blackbody source with a plate shape in laboratory, and the error analysis and data inversion are made based on the calibration results. Firstly, through analyzing the influencing factors including optical system, detector and signal processing circuit, the optical response model is established. Then, the radiometric calibration experiment is developed in the darkroom environment, and the error analysis is done from six aspects, which are the temperature and radiation instability of the black body, goniometer accuracy, angular resolution, the instability of detector output, data fitting error. Finally, according to the calibration results and the imaging characteristics of short-range airplane in the system, the infrared radiation intensity of aircraft target is calculated. The radiometric calibration and data inversion will benefit obtaining the target radiation characteristic during the system application, and can provide data reference for target detection, recognition, classification, so on. (C) 2013 Elsevier B.V. All rights reserved. ¹Ø¼ü´Ê ×÷Õ߹ؼü´Ê:Radiometric calibration; Super wide-angle staring; SWSIIS; Data inversion ×÷ÕßÐÅÏ¢ ͨѶ×÷ÕßµØÖ·: Huang, FY (ͨѶ×÷Õß) Shijiazhuang Mech Engn Coll, Dept Elect & Opt Engn, Shijiazhuang, Hebei, Peoples R China. µØÖ·: [ 1 ] Shijiazhuang Mech Engn Coll, Dept Elect & Opt Engn, Shijiazhuang, Hebei, Peoples R China µç×ÓÓʼþµØÖ·:hfyoptics@163.com ³ö°æÉÌ ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS Àà±ð / ·ÖÀà Ñо¿·½Ïò:Instruments & Instrumentation; Optics; Physics Web of Science Àà±ð:Instruments & Instrumentation; Optics; Physics, Applied ÎÄÏ×ÐÅÏ¢ ÎÄÏ×ÀàÐÍ:Article ÓïÖÖ:English Èë²ØºÅ: WOS:000328233600003 ISSN: 1350-4495 µç×Ó ISSN: 1879-0275 ÆÚ¿¯ÐÅÏ¢ Impact Factor (Ó°ÏìÒò×Ó): Journal Citation Reports® ÆäËûÐÅÏ¢ IDS ºÅ: 269HY Web of Science ºËÐĺϼ¯ÖÐµÄ "ÒýÓõIJο¼ÎÄÏ×": 15 Web of Science ºËÐĺϼ¯ÖÐµÄ "±»ÒýƵ´Î": 0 |
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