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lvubaby木虫 (正式写手)
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[求助]
据说AMM401-403检索了，求帮忙查询啊
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如题： 1. Modeling the phonon transport in nanowire with different cross-section. Applied Mechanics and Materials Vols. 401-403 (2013) pp 852-855. 2. Novel iterative truncated total least squares algorithm for image restoration. Applied Mechanics and Materials Vols. 401-403 (2013) |
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weiwenkong
铜虫 (小有名气)
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lvubaby: 金币+5, ★★★★★最佳答案 2013-11-23 11:20:50
lvubaby: 金币+5, ★★★★★最佳答案 2013-11-23 11:20:50
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Accession number: 20134516959740 Title: Modeling the phonon transport in nanowire with different cross-section Authors: Su, Gao Hui1 ; Yang, Zi Chun1 ; Sun, Feng Rui1 Author affiliation: 1 College of Power Engineering, Navy University of Engineering, Wuhan, 430033, China Source title: Applied Mechanics and Materials Abbreviated source title: Appl. Mech. Mater. Volume: 401-403 Monograph title: Frontiers of Manufacturing Science and Measuring Technology III Issue date: 2013 Publication year: 2013 Pages: 852-855 Language: English ISSN: 16609336 E-ISSN: 16627482 ISBN-13: 9783037858462 Document type: Conference article (CA) Conference name: 3rd International Conference on Frontiers of Manufacturing Science and Measuring Technology, ICFMM 2013 Conference date: July 30, 2013 - July 31, 2013 Conference location: LiJiang, China Conference code: 100431 Sponsor: Control Engineering and Information Science; Research Association; International Frontiers of science and technology; Research Association; Trans Tech Publications; Chin-Yi University of Technology Publisher: Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland Abstract: The phonon transport in silicon nanowire was simulated by Monte Carlo Method (MCM). The effect on the phonon transport of the boundary reflection mode, cross-section size and cross-section shape was studied. Analysis shows that diffuse reflection can result in phonon accumulation at the circumferential boundary. As the cross-section size decrease, the nonuniformity of the temperature distribution within the cross-section becomes more severe. When the area of the square cross-section silicon nanowire (SCSN) is equal to that of the circular cross-section silicon nanowire (CCSN), the thermal conductivity of them is more close to each other. © (2013) Trans Tech Publications, Switzerland. Number of references: 4 Main heading: Thermal conductivity Controlled terms: Manufacture - Monte Carlo methods - Nanowires - Phonons - Silicon Uncontrolled terms: Boundary reflection - Circular cross-sections - Cross-section - Cross-section shapes - Diffuse reflection - Phonon transport - Silicon nanowires - Square cross-section Classification code: 933 Solid State Physics - 922.2 Mathematical Statistics - 761 Nanotechnology - 751.1 Acoustic Waves - 712.1.1 Single Element Semiconducting Materials - 641.2 Heat Transfer - 537.1 Heat Treatment Processes DOI: 10.4028/www.scientific.net/AMM.401-403.852 Database: Compendex Compilation and indexing terms, © 2013 Elsevier Inc. |
2楼2013-11-22 16:59:56
weiwenkong
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lvubaby: 金币+5, ★★★★★最佳答案 2013-11-23 11:20:42
lvubaby: 金币+5, ★★★★★最佳答案 2013-11-23 11:20:42
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Accession number: 20134516959857 Title: Novel iterative truncated total least squares algorithm for image restoration Authors: Zhang, L.1 ; Cao, Y.Y.1 ; Yang, Z.C.1 Author affiliation: 1 Power Engineering college, Naval University of Engineering, WuHan 430033, China Source title: Applied Mechanics and Materials Abbreviated source title: Appl. Mech. Mater. Volume: 401-403 Monograph title: Frontiers of Manufacturing Science and Measuring Technology III Issue date: 2013 Publication year: 2013 Pages: 1397-1400 Language: English ISSN: 16609336 E-ISSN: 16627482 ISBN-13: 9783037858462 Document type: Conference article (CA) Conference name: 3rd International Conference on Frontiers of Manufacturing Science and Measuring Technology, ICFMM 2013 Conference date: July 30, 2013 - July 31, 2013 Conference location: LiJiang, China Conference code: 100431 Sponsor: Control Engineering and Information Science; Research Association; International Frontiers of science and technology; Research Association; Trans Tech Publications; Chin-Yi University of Technology Publisher: Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland Abstract: Image restoration is a typical ill-posed inverse problem, which can be solved by a successful total least squares (TLS) method when not only the observation but the system matrix is also contaminated by addition noise. Considering the image restoration is a large-scale problem in general, project the TLS problem onto a subspace defined by a Lanczos bidiagonalization algorithm, and then the Truncated TLS method is applied on the subspace. Therefore, a novel iterative TTLS method, involving appropriate the choice of truncation parameter, is proposed. Finally, an Image reconstruction example is given to illustrate the effectiveness and robustness of proposed algorithm. © (2013) Trans Tech Publications, Switzerland. Number of references: 6 Main heading: Least squares approximations Controlled terms: Algorithms - Image reconstruction - Inverse problems - Iterative methods - Manufacture - Seebeck effect Uncontrolled terms: Ill posed problem - ILL-posed inverse problem - Lanczos - Large-scale problem - Regularization - System matrices - Total least squares - Truncation parameter Classification code: 537.1 Heat Treatment Processes - 615.4 Thermoelectric Energy - 741 Light, Optics and Optical Devices - 921 Mathematics - 921.6 Numerical Methods DOI: 10.4028/www.scientific.net/AMM.401-403.1397 Database: Compendex Compilation and indexing terms, © 2013 Elsevier Inc. |
3楼2013-11-22 17:00:59
