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[资源] Fundamentals of Nanoscale Film Analysis （纳米薄膜分析）

Fundamentals of Nanoscale Film Analysis
By Terry L Alford, L.C. Feldman, James W. Mayer

Publisher: Springer
Number Of Pages: 330
Publication Date: 2007-02-16

好书不用多说，看目录便知！大家一起顶啊！

1. An Overview: Concepts, Units, and the Bohr Atom ............................. 1
1.1 Introduction ..................................................................... 1
1.2 Nomenclature ................................................................... 2
1.3 Energies, Units, and Particles ................................................ 6
1.4 Particle–Wave Duality and Lattice Spacing ............................... 8
1.5 The Bohr Model................................................................ 9
Problems.................................................................................. 10
2. Atomic Collisions and Backscattering Spectrometry ............................ 12
2.1 Introduction ..................................................................... 12
2.2 Kinematics of Elastic Collisions ............................................ 13
2.3 Rutherford Backscattering Spectrometry .................................. 16
2.4 Scattering Cross Section and Impact Parameter.......................... 17
2.5 Central Force Scattering ...................................................... 18
2.6 Scattering Cross Section: Two-Body ....................................... 21
2.7 Deviations from Rutherford Scattering at Low and High Energy..... 23
2.8 Low-Energy Ion Scattering................................................... 24
2.9 Forward Recoil Spectrometry................................................ 28
2.10 Center of Mass to Laboratory Transformation............................ 28
Problems.................................................................................. 31
3. Energy Loss of Light Ions and Backscattering Depth Profiles ................. 34
3.1 Introduction ..................................................................... 34
3.2 General Picture of Energy Loss and Units of Energy Loss............. 34
3.3 Energy Loss of MeV Light Ions in Solids ................................. 35
3.4 Energy Loss in Compounds—Bragg’s Rule............................... 40
3.5 The Energy Width in Backscattering ....................................... 40
3.6 The Shape of the Backscattering Spectrum ............................... 43
3.7 Depth Profiles with Rutherford Scattering................................. 45
3.8 Depth Resolution and Energy-Loss Straggling ........................... 47
viii Contents
3.9 Hydrogen and Deuterium Depth Profiles .................................. 50
3.10 Ranges of H and He Ions ..................................................... 52
3.11 Sputtering and Limits to Sensitivity ........................................ 54
3.12 Summary of Scattering Relations ........................................... 55
Problems.................................................................................. 55
4. Sputter Depth Profiles and Secondary Ion Mass Spectroscopy ................ 59
4.1 Introduction ..................................................................... 59
4.2 Sputtering by Ion Bombardment—General Concepts................... 60
4.3 Nuclear Energy Loss .......................................................... 63
4.4 Sputtering Yield ................................................................ 67
4.5 Secondary Ion Mass Spectroscopy (SIMS)................................ 69
4.6 Secondary Neutral Mass Spectroscopy (SNMS)......................... 73
4.7 Preferential Sputtering and Depth Profiles ................................ 75
4.8 Interface Broadening and Ion Mixing ...................................... 77
4.9 Thomas–Fermi Statistical Model of the Atom............................ 80
Problems.................................................................................. 81
5. Ion Channeling .......................................................................... 84
5.1 Introduction ..................................................................... 84
5.2 Channeling in Single Crystals ............................................... 84
5.3 Lattice Location of Impurities in Crystals ................................. 88
5.4 Channeling Flux Distributions............................................... 89
5.5 Surface Interaction via a Two-Atom Model............................... 92
5.6 The Surface Peak............................................................... 95
5.7 Substrate Shadowing: Epitaxial Au on Ag(111).......................... 97
5.8 Epitaxial Growth ............................................................... 99
5.9 Thin Film Analysis
6. Electron–Electron Interactions and the Depth Sensitivity of
Electron Spectroscopies ............................................................... 105

7. X-ray Diffraction........................................................................ 129
8. Electron Diffraction .................................................................... 152
9. Photon Absorption in Solids and EXAFS.......................................... 174
10. X-ray Photoelectron Spectroscopy .................................................. 11. Radiative Transitions and the Electron Microprobe..............................
12. Nonradiative Transitions and Auger Electron Spectroscopy....................
13. Nuclear Techniques: Activation Analysis and Prompt Radiation Analysis ..
14. Scanning Probe Microscopy..........................................................

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[ Last edited by universemaster on 2007-10-2 at 12:38 ]

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[资源] Fundamentals of Nanoscale Film Analysis （纳米薄膜分析）

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