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From the foregoing discussion of the XRD results, the grain size after annealing change little, and thus the contribution of grain boundary scattering to the abnormal increase in the resistivity can be ignored. The abnormal increase in the resistivity may be closely related to the interface scattering enhancement.

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°Ñ×îºóµÄÒ»¾ä»°  The abnormal increase in the resistivity may be closely related to the interface scattering enhancementÈáµ½Ç°ÃæµÄÒ»¾ä»°ÀïÈ¥. ۳ɏö¸´Ôӵij¤ÄѾäÄÇÖÖ  ¾ÍÊÇÎÄÏ×Àï³öÏÖµÄÄÇÖÖ

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hookhans

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Farmer

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From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of grain boundary scattering to the abnormal resistivity increase that is closely related to the interface scattering enhancement can be ignored.
where-there-is-a-will-there-is-a-way.
2Â¥2013-03-15 12:18:02
ÒÑÔÄ   »Ø¸´´ËÂ¥   ¹Ø×¢TA ¸øTA·¢ÏûÏ¢ ËÍTAºì»¨ TAµÄ»ØÌû

hookhans

Ìú¸Ëľ³æ (ÖøÃûдÊÖ)

Farmer

¡¾´ð°¸¡¿Ó¦Öú»ØÌû

From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of the grain boundary scattering to the abnormal resistivity increase that is closely related to the interface scattering enhancement can be ignored.
where-there-is-a-will-there-is-a-way.
3Â¥2013-03-15 12:43:33
ÒÑÔÄ   »Ø¸´´ËÂ¥   ¹Ø×¢TA ¸øTA·¢ÏûÏ¢ ËÍTAºì»¨ TAµÄ»ØÌû

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гæ (ÖøÃûдÊÖ)

ÒýÓûØÌû:
3Â¥: Originally posted by hookhans at 2013-03-15 12:43:33
From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of the grain boundary scatterin ...

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The abnormal increase in the resistivity may be closely related to the interface scattering enhancement
Õâ¾äÒª·ÅÔÚ×îºóŶ ÒÔÒý³öÎÒÏÂÃæµÄÌÖÂÛ  ¿´¿´»¹¿ÉÒÔÐÞÊβ»?лл°¢
4Â¥2013-03-15 14:20:00
ÒÑÔÄ   »Ø¸´´ËÂ¥   ¹Ø×¢TA ¸øTA·¢ÏûÏ¢ ËÍTAºì»¨ TAµÄ»ØÌû

hookhans

Ìú¸Ëľ³æ (ÖøÃûдÊÖ)

Farmer

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ÄûÃÊÊ÷: ½ð±Ò+10, ·­ÒëEPI+1, ¡ï¡ï¡ï¡ï¡ï×î¼Ñ´ð°¸, Õâ¸ö¾ä×ÓÌ«°ôÁË ·­ÒëµÄÌ«¸ÐÈËÁË Ð»Ð»¹þ 2013-03-15 14:54:01
1) From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of the grain boundary scattering can be ignored£¬since the abnormal increase in the resistivity may be closely related to the interface scattering enhancement.  
2) From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of the grain boundary scattering to  the abnormal increase in the resistivity can be ignored£¬since the latter may be closely related to the interface scattering enhancement.
where-there-is-a-will-there-is-a-way.
5Â¥2013-03-15 14:52:45
ÒÑÔÄ   »Ø¸´´ËÂ¥   ¹Ø×¢TA ¸øTA·¢ÏûÏ¢ ËÍTAºì»¨ TAµÄ»ØÌû
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