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ÄûÃÊÊ÷гæ (ÖøÃûдÊÖ)
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From the foregoing discussion of the XRD results, the grain size after annealing change little, and thus the contribution of grain boundary scattering to the abnormal increase in the resistivity can be ignored. The abnormal increase in the resistivity may be closely related to the interface scattering enhancement. ÎÒдµÄÓÖÂÞà ÓÖûÓÐÎÄ²É ÇóÖú´óϺ°ïÎÒÈóÉ« °Ñ×îºóµÄÒ»¾ä»° The abnormal increase in the resistivity may be closely related to the interface scattering enhancementÈáµ½Ç°ÃæµÄÒ»¾ä»°ÀïÈ¥. ۳ɏö¸´Ôӵij¤ÄѾäÄÇÖÖ ¾ÍÊÇÎÄÏ×Àï³öÏÖµÄÄÇÖÖ |
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hookhans
Ìú¸Ëľ³æ (ÖøÃûдÊÖ)
Farmer
- ·ÒëEPI: 263
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- ×¢²á: 2013-01-25
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| From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of grain boundary scattering to the abnormal resistivity increase that is closely related to the interface scattering enhancement can be ignored. |

2Â¥2013-03-15 12:18:02
hookhans
Ìú¸Ëľ³æ (ÖøÃûдÊÖ)
Farmer
- ·ÒëEPI: 263
- Ó¦Öú: 186 (¸ßÖÐÉú)
- ¹ó±ö: 0.142
- ½ð±Ò: 7967.5
- É¢½ð: 576
- ºì»¨: 51
- Ìû×Ó: 2088
- ÔÚÏß: 401.2Сʱ
- ³æºÅ: 2260260
- ×¢²á: 2013-01-25
- רҵ: ´ß»¯»¯Ñ§
¡¾´ð°¸¡¿Ó¦Öú»ØÌû
| From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of the grain boundary scattering to the abnormal resistivity increase that is closely related to the interface scattering enhancement can be ignored. |

3Â¥2013-03-15 12:43:33
ÄûÃÊÊ÷
гæ (ÖøÃûдÊÖ)
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4Â¥2013-03-15 14:20:00
hookhans
Ìú¸Ëľ³æ (ÖøÃûдÊÖ)
Farmer
- ·ÒëEPI: 263
- Ó¦Öú: 186 (¸ßÖÐÉú)
- ¹ó±ö: 0.142
- ½ð±Ò: 7967.5
- É¢½ð: 576
- ºì»¨: 51
- Ìû×Ó: 2088
- ÔÚÏß: 401.2Сʱ
- ³æºÅ: 2260260
- ×¢²á: 2013-01-25
- רҵ: ´ß»¯»¯Ñ§
¡¾´ð°¸¡¿Ó¦Öú»ØÌû
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ÄûÃÊÊ÷: ½ð±Ò+10, ·ÒëEPI+1, ¡ï¡ï¡ï¡ï¡ï×î¼Ñ´ð°¸, Õâ¸ö¾ä×ÓÌ«°ôÁË ·ÒëµÄÌ«¸ÐÈËÁË Ð»Ð»¹þ 2013-03-15 14:54:01
ÄûÃÊÊ÷: ½ð±Ò+10, ·ÒëEPI+1, ¡ï¡ï¡ï¡ï¡ï×î¼Ñ´ð°¸, Õâ¸ö¾ä×ÓÌ«°ôÁË ·ÒëµÄÌ«¸ÐÈËÁË Ð»Ð»¹þ 2013-03-15 14:54:01
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1) From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of the grain boundary scattering can be ignored£¬since the abnormal increase in the resistivity may be closely related to the interface scattering enhancement. 2) From the foregoing discussion of the XRD results, it can be seen that annealing does not have significant impact on the grain size, demonstrating that the contribution of the grain boundary scattering to the abnormal increase in the resistivity can be ignored£¬since the latter may be closely related to the interface scattering enhancement. |

5Â¥2013-03-15 14:52:45














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