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[×ÊÔ´] Introduction to Conventional Transmission Electron Microscopy

Introduction to Conventional Transmission Electron Microscopy £¨ÒÑËÑË÷£¬ÎÞÖØ¸´£©Ö»ÊÇÔÚСľ³æµÄhttp://blog.muchong.com/269652/viewspace-28774.htmlµÄ²©¿ÍÖÐÓÐÒ»µãÕâ±¾ÊéµÄ½éÉÜ¡£µ«ÊǺÃÏñûÓиø³öÁ´½Ó¡£ÎÒÕâÀï¸øµÄÓÐÏÂÔØÁ´½Ó¡£Õû¸öÎļþ63M¡£

Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science)


Publisher:   Cambridge University Press
Number Of Pages:   740
Publication Date:   2003-04-21
Sales Rank:   3181281
ISBN / ASIN:   0521620066
EAN:   9780521620062
Binding:   Hardcover
Manufacturer:   Cambridge University Press
Studio:   Cambridge University Press
Average Rating:   4.5


This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. In addition to including a large selection of worked examples and homework problems, the volume is accompanied by a supplementary website (http://ctem.web.cmu.edu/) containing interactive modules and over 30,000 lines of free Fortran 90 source code. The work is based on a lecture course given by Marc De read.freeduan.com Graef in the Department of Materials Science and Engineering at Carnegie Mellon University.



Download Description:

This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.


Review:

Wonderful Introduction to Transmission Electron Microscopy

For my taste, this book is the best introduction to Transmission Electron Microscopy that I have read. It is written at a higher level than Williams and Carter. This book is probably best suited to students with a B.S. in Physics. At the very least one should have benefited from a two semester undergraduate course on Modern Physics (including such things as solving the Schrodinger Equation for the Hydrogen atom) before tackling this book. I wish that a book like this had been out thirty years ago when I started learning TEM! This book does a very good job on two-beam theory and has truly wonderful dispersion surface diagrams.

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