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·¢±íSCIÆÚ¿¯£¬Éó¸åÈ˵ÄÒâ¼ûÒªÇó½âÊÍÍâÍÆ·¨µÄÔÀí¡£ÒòΪÎÒ¿´Á˺ܶàÎÄÏ×¶¼ÊÇÖ±½ÓÓ¦Ó㬲»ÖªµÀÔõô½âÊÍÁË£¬Çó¸÷λ´óÉñ°ïæ·ÖÎöÏ£¬Èç¹ûÄÜÌṩ²Î¿¼×ÊÁÏÒ²²»Éõ¸Ð¼¤£¡![]() Éó¸åÒâ¼ûÈçÏ£ºÎÒÔÎÄÕ³Ìù¹ýÀ´ÁË£¬·ÒëÊÇÎÒ×Ô¼º·ÒëµÄ£¬ÏÂÃæµÄÎҲο¼ÆäËüÎÄÕµÄÕâ¸öÎÄÏ×µÄÊéÎÒÓÖÕÒ²»µ½¡£ (1) It is well known that there are a few limitations to use EDS for quantitatively elemental analyses because the interaction volume of characteristic X-ray is pretty large and also the overlap of grains and precipitates in the thickness direction. The authors mentioned that they used the extrapolation technique described by Lorimer to determine the composition of the phase in their study. They should briefly discuss the principle of this method. Also, the relevant reference should be cited. ·Òë£ºÌØÕ÷XÉäÏßµÄ×÷ÓÃÌå»ýºÜ´ó£¬²¢ÇÒÔÚºñ¶È·½ÏòÓо§Á£ºÍÎö³öÏàµÄÖØµþ¡£×÷ÕßÖ¸³ö²ÉÓÃÍâÍÆ·½·¨È·¶¨Îö³öÏàµÄ³É·Ö£¬Ó¦µ±¸ø³ö·½·¨µÄÔÀí£¬ÒÔ¼°ÏàÓ¦µÄÎÄÏס£ ÎÄÏ×£ºLorimer G.W., Cliff G., Champness P.E., Dickinson C., Hasan, F., Kenway P.B. Analytical electron microscopy. San Francisco Press: 1984. p. 153. |
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