| 查看: 2260 | 回复: 5 | ||
| 【奖励】 本帖被评价4次，作者子男增加金币 2.5 个 | ||
| 当前主题已经存档。 | ||
[资源]
文献<粉末XRD综述>
|
||
|
粉末XRD综述 Contents Page 1. Introduction 135 2. Basic principles 137 2.1. Characteristics of powder diffraction patterns 137 2.2. Diffraction line profiles 139 2.3. Convolution and deconvolution 140 2.4. Structural imperfections 142 3. Modelling of powder diffraction data 145 3.1. General considerations 145 3.2. Line-profile functions 146 3.3. Total pattern fitting 148 3.4. Reliability, precision and accuracy 152 4. Instrumentation and experimental considerations 154 4.1. Sources of radiation 154 4.2. Diffractometers and cameras 159 4.3. Detectors 160 4.4. Non-ambient diffraction 163 4.5. Sample preparation and experimental strategy 165 4.6. Instrument characterization and Standard Reference Materials 166 5. Databases and phase identification 169 5.1. Databases 169 5.2. Phase identification (Search/Match) 172 6. Crystal structure refinement from powder data 177 6.1. Factors affecting precision and accuracy 177 6.2. Current practices with the Rietveld method 182 6.3. Some applications of the Rietveld method 182 6.4. Pattern decomposition and structure refinement 188 7. Ab initio structure determination 188 7.1. Historical overview 188 7.2. Powder pattern indexing 189 7.3. Extraction of integrated intensities 192 7.4. Structure solution 193 7.5. Combined X-ray and neutron diffraction 196 7.6. Noteworthy examples of ab initio structure determination 197 7.7. Integrated software 197 8. Resonant diffraction (anomalous dispersion) 198 9. Quantitative phase analysis 199 9.1. Introduction 199 9.2. The internal-standard and the reference-intensity-ratio methods 200 9.3. Quantitative phase analysis by the Rietveld method 201 10. Line-profile analysis and microstructural properties 202 134 J I Langford and D Lou¨er 10.1.Microstructure of materials 202 10.2.Analysis of microstructure based on Fourier series 202 10.3.Integral-breadth methods 209 11. Dynamic and non-ambient diffraction 211 11.1.Time- and temperature-dependent powder diffraction 211 11.2.High pressure diffraction 216 11.3.Magnetic X-ray powder diffraction 219 12. Concluding remarks 220 Appendix. Analytical functions commonly used to model powder diffraction line profiles 221 References 223 |
回复此楼» 猜你喜欢
在MOF中，有没有羧基参加配位的情况
已经有2人回复
-
招2026年入学上海交通大学博士生，急！！！
已经有1人回复
-
无机化学论文润色/翻译怎么收费?
已经有131人回复
-
理论计算合作
已经有0人回复
-
求高校合作
已经有1人回复
-
27级无机化学申博自荐
已经有2人回复
-
Chemdraw免费软件
已经有0人回复
-
单晶结构解析，各类疑难晶体数据处理和答疑
已经有38人回复
-
这个水相反应有没有催化剂促进发生
已经有4人回复
-
Mn Me3TACN
已经有5人回复
2楼2007-08-12 15:17:18
3楼2007-08-12 18:30:50
|
本帖内容被屏蔽 |
4楼2007-08-13 21:54:58
5楼2007-08-17 12:26:00
20