| 查看: 5818 | 回复: 183 | ||
| 本帖产生 1 个 ACI ，点击这里进行查看 | ||
| 当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖 | ||
[资源]
2012原子力显微分析新著 Atomic Force Microscopy
|
||
|
书名：Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale Edited by Victor Bellitto, ISBN 978-953-51-0414-8, Hard cover, 256 pages, Publisher: InTech, Published: March 23, 2012 With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development  2058.jpg [ 来自科研家族 锂电池世界 ] |
回复此楼» 本帖附件资源列表
-
欢迎监督和反馈：小木虫仅提供交流平台，不对该内容负责。
本内容由用户自主发布，如果其内容涉及到知识产权问题，其责任在于用户本人，如对版权有异议，请联系邮箱：xiaomuchong@tal.com - 附件 1 : Atomic_Force_Microscopy_-_Imaging__Measuring_and_Manipulating_Surfaces_at_the_Atomic_Scale.pdf
2012-11-06 15:16:54, 19.81 M
» 本帖已获得的红花（最新10朵）
everie» 猜你喜欢
83楼2012-11-12 13:29:55
7楼2012-11-07 00:07:08
14楼2012-11-07 13:31:15
简单回复
听不到3楼
2012-11-06 15:27
回复
五星好评 顶一下，感谢分享！
天堂方向4楼
2012-11-06 16:59
回复
五星好评 顶一下，感谢分享！
2012-11-06 21:35
回复
五星好评 顶一下，感谢分享！
sd9896楼
2012-11-06 22:30
回复
五星好评 顶一下，感谢分享！
2012-11-07 09:11
回复
五星好评 顶一下，感谢分享！
2012-11-07 10:12
回复
五星好评 顶一下，感谢分享！
浅浅210楼
2012-11-07 10:32
回复
五星好评 顶一下，感谢分享！
平凡一颗心11楼
2012-11-07 10:47
回复
三星好评 顶一下，感谢分享！
superzhc312楼
2012-11-07 12:38
回复
五星好评 顶一下，感谢分享！
changyur_woo13楼
2012-11-07 13:01
回复
五星好评 顶一下，感谢分享！
