24小时热门版块排行榜

>论坛更新日志 (3996)
>导师招生 (333)
>休闲灌水 (168)
>招聘信息布告栏 (139)
>论文道贺祈福 (113)
>虫友互识 (113)
>硕博家园 (97)
>文献求助 (93)
>找工作 (45)
>考研 (45)
>考博 (41)
>基金申请 (40)
>博后之家 (30)
>生物科学 (29)
>教师之家 (21)
>医学 (18)

返回列表

【奖励】本帖被评价172次，作者wenke1526增加金币 136.6 个

本帖产生 1 个 ACI ，点击这里进行查看

当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖

wenke1526

荣誉版主 (著名写手)

ACI: 1
应助: 9 (幼儿园)
贵宾: 0.317
金币: 12575
帖子: 1344
在线: 1132.1小时
虫号: 448379

[资源] 2012原子力显微分析新著 Atomic Force Microscopy

书名：Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
Edited by Victor Bellitto, ISBN 978-953-51-0414-8, Hard cover, 256 pages, Publisher: InTech, Published: March 23, 2012

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development
2058.jpg

[ 来自科研家族锂电池世界 ]

回复此楼

» 本帖附件资源列表

欢迎监督和反馈：小木虫仅提供交流平台，不对该内容负责。
本内容由用户自主发布，如果其内容涉及到知识产权问题，其责任在于用户本人，如对版权有异议，请联系邮箱：xiaomuchong@tal.com
附件 1 : Atomic_Force_Microscopy_-_Imaging__Measuring_and_Manipulating_Surfaces_at_the_Atomic_Scale.pdf

2012-11-06 15:16:54, 19.81 M

» 收录本帖的淘帖专辑推荐

» 本帖已获得的红花（最新10朵）

everie

lin14051

» 猜你喜欢

1楼 2012-11-06 15:17:30

已阅回复此楼关注TA 给TA发消息送TA红花 TA的回帖

相关版块跳转我要订阅楼主 wenke1526 的主题更新

返回列表

☆ 无星级 ★ 一星级 ★★★ 三星级 ★★★★★ 五星级

普通表情龙兔虎猫高级回复 (可上传附件)