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Çó½Ì low-frequency lock-in techniques ÔÀí
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ÔÚһƪÎÄÏ×ÉÏ¿´µ½Õâ¸ö£¬Ô»°ÈçÏ£º After establishing a safe range of top-gate voltage, the source − drain resistance of each G-GO FET was measured using low-frequency lock-in techniques while sweeping Vtg and back-gate voltage Vbg. ÎÒÏëÎÊÏÂÕâ¸öµ½µ×ÊÇʲôÔÀí ³ÆÎªµÍÆµËøÏ༼Êõ£¿ Çë¸ßÈËÖ¸½Ì лл |
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