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°®ÓëÓêÏÂ(½ð±Ò+1): 2012-02-22 19:01:50
jxlcwy(½ð±Ò+30, ·ÒëEPI+1): ¡ï¡ï¡ï¡ï¡ï×î¼Ñ´ð°¸ 2012-02-23 10:37:27
jxlcwy(½ð±Ò+30, ·ÒëEPI+1): ¡ï¡ï¡ï¡ï¡ï×î¼Ñ´ð°¸ 2012-02-23 10:37:27
| This article investigated the influence of SiO2 content on phase structure ¡¢microstructure and dielectrical property of ceramic material. SiO2 do not reacted with CCTO when sintered at high temperature, it existed on the grain boundary of ceramic material as a second phase,the addition of SiO2 influences the morphology of grains inside , for example, low content of (1wt%) SiO2 can inhibit the grain growth of CCTO ceramic, high content of (higher than 2wt%), however,the addition of SiO2 have nearly no influence on grain resistance of CCTO ceramic, but the grain boundary resistance increase with the addition of SiO2 which induced the decrease of dielectric loss in CCTO ceramic, the addition of SiO2 can make CCTO keep a relative high dielectric constant and low dielectric loss ,it shows an bright development and application prospects. |

2Â¥2012-02-22 16:53:53













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