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ebook: Instrumentation and Metrology for Nanotechnology Report
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Advances in instrumentation and metrology have enabled two decades of remarkable nanoscience and nanotechnology research. However, the resolution, accuracy, and capability of currently available instruments and tools are being stretched to the limit by the demands of researchers and are not expected to robust enough for incorporating nanotechnology into commercial products and manufacturing processes. The National Nanotechnology Initiative's (NNI) latest report, Instrumentation and Metrology for Nanotechnology, identifies and highlights research needs in five priority areas for nanotechnology-related instrumentation and metrology and includes a discussion of crosscutting computational science issues and challenges. The priority areas are: * Nanocharacterization * Nanomechanics * Nanoelectronics, nanomagnetics, and nanophotonics * Nanofabrication * Nanomanufacturing Instrumentation and metrology are vital components to applications from electronics to medicine and crosscut all the NNI areas of research and application. This report is one of a series of reports resulting from topical workshops held by the Nanoscale Science, Engineering, and Technology (NSET) Subcommittee of the National Science and Technology Council's Committee on Technology through the National Nanotechnology Coordination Office (NNCO). downloadlink: http://www.box.net/public/ykkitgsxh7 [ Last edited by dgf2008 on 2008-10-13 at 18:37 ] |
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