| 查看: 2281 | 回复: 13 | ||
| 【奖励】 本帖被评价8次，作者winds001增加金币 7.5 个 | ||
| 当前主题已经存档。 | ||
| 当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖 | ||
[资源]
ebook: Instrumentation and Metrology for Nanotechnology Report
|
||
|
Advances in instrumentation and metrology have enabled two decades of remarkable nanoscience and nanotechnology research. However, the resolution, accuracy, and capability of currently available instruments and tools are being stretched to the limit by the demands of researchers and are not expected to robust enough for incorporating nanotechnology into commercial products and manufacturing processes. The National Nanotechnology Initiative's (NNI) latest report, Instrumentation and Metrology for Nanotechnology, identifies and highlights research needs in five priority areas for nanotechnology-related instrumentation and metrology and includes a discussion of crosscutting computational science issues and challenges. The priority areas are: * Nanocharacterization * Nanomechanics * Nanoelectronics, nanomagnetics, and nanophotonics * Nanofabrication * Nanomanufacturing Instrumentation and metrology are vital components to applications from electronics to medicine and crosscut all the NNI areas of research and application. This report is one of a series of reports resulting from topical workshops held by the Nanoscale Science, Engineering, and Technology (NSET) Subcommittee of the National Science and Technology Council's Committee on Technology through the National Nanotechnology Coordination Office (NNCO). downloadlink: http://www.box.net/public/ykkitgsxh7 [ Last edited by dgf2008 on 2008-10-13 at 18:37 ] |
回复此楼» 猜你喜欢
修改论文，如何借助其他力量？
已经有4人回复
-
中山大学潘越教授课题组2027级推免硕士研究生招生 新增一个专业医学技术名额
已经有21人回复
-
金属材料论文润色/翻译怎么收费?
已经有238人回复
6楼2007-01-20 06:48:32
3楼2007-01-19 19:15:50
5楼2007-01-19 23:13:01
7楼2007-01-20 08:46:27
20