| 查看: 150 | 回复: 2 | |||
| 当前主题已经存档。 | |||
[交流]
【学术求助】椭圆光度计原理求教！
|
|||
偶遇 椭圆 光学光度Sample Text计可测薄膜厚度，但不知道其原理，请赐教，谢谢！ [ Last edited by mainpro on 2006-10-16 at 23:31 ] |
回复此楼» 猜你喜欢
急需调剂
已经有9人回复
-
申博/考博
已经有4人回复
-
化工学硕294分，求导师收留
已经有37人回复
-
求调剂
已经有11人回复
-
260求调剂
已经有4人回复
-
一志愿华中农业071010，320求调剂
已经有19人回复
-
304求调剂
已经有7人回复
-
求博导｜生物质基多孔碳/超级电容方向，已有相关成果，寻能源材料/碳材料方向老师
已经有3人回复
-
二苯甲酮酸类衍生物
已经有6人回复
-
接受任何调剂
已经有4人回复
westwolf
木虫 (著名写手)
- 应助: 3 (幼儿园)
- 贵宾: 2.5
- 金币: 3732.4
- 散金: 954
- 红花: 5
- 帖子: 1338
- 在线: 55.4小时
- 虫号: 120650
- 注册: 2005-12-03
- 性别: GG
- 专业: 无机非金属基复合材料
0.25
★ ★
imrking(金币+2):3x
imrking(金币+2):3x
|
The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films Alexandre Rothen Laboratories of The Rockefeller Institute for Medical Research, New York, New York Review of Scientific Instruments -- February 1945 -- Volume 16, Issue 2, pp. 26-30 An apparatus designed to determine the thickness of films deposited on metal slides is described. It is based on the measurement of the change that takes place in ellipticity of the light reflected after a slide has been coated with the film under investigation. The apparatus is capable of measuring a film thickness within ±0.3A, a sensitivity at least ten times greater than that obtained with the method based on light interference. Review of Scientific Instruments is copyrighted by The American Institute of Physics. http://scitation.aip.org/getabs/ ... =cvips&gifs=yes |
2楼2006-10-16 09:55:15
3楼2006-10-16 13:15:58
20