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To determine the orientation of the as-grown XXX single crystal, XRD2 was conducted on the cross-section of the crystal (Fig. 4 a). It can be found that there is only one peak at 35.35° which can be indexed to (0 0 2) plane. It means that the XXX crystal grows along the c-axis direction. The cleavage plane parallel to the growth direction was also tasted by XRD2, as shown in Fig 4b. There are two peaks at 38.11° and 65.80°, which can be indexed to (0 6 0) and (0 10 0) plan, respectively. The above results suggested that the grown sample is a single crystal of high perfection. The macroscopic defects, such as low-angle grain boundaries and inclusions of the as-grown crystal, were also checked by polarized-light microscopy in transmission configuration. Fig. 1 c shows a photograph of the wafer (Fig. 1 b) under polarized-light. Neither inculcations nor low angle-grain boundaries were observed on the wafer. |
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lliang921(金币+15, 翻译EPI+1): 2011-02-28 10:16:46
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To determine the orientation of the as-grown XXX single crystal, XRD2 was conducted on the cross-section of the crystal (Fig. 4 a). It can be found that there is only one peak at 35.35° which can be indexed to (0 0 2) plane. It means that the XXX crystal grows along the c-axis direction. The cleavage plane parallel to the growth direction was also tasted by XRD2, as shown in Fig 4b. There are two peaks at 38.11° and 65.80°, which can be indexed to (0 6 0) and (0 10 0) plan, respectively. The above results suggested that the grown sample is a single crystal of high perfection. The macroscopic defects, such as low-angle grain boundaries and inclusions of the as-grown crystal, were also checked by polarized-light microscopy in transmission configuration. Fig. 1 c shows a photograph of the wafer (Fig. 1 b) under polarized-light. Neither inculcations nor low angle-grain boundaries were observed on the wafer. 没有大的语法错误，时态要一致，一般实验的东西写论文都是用过去式的！ |
2楼2011-02-27 08:04:53
|
To determine the orientation of the as-grown XXX single crystal, XRD2 was conducted on the cross-section of the crystal (Fig. 4 a). It (could) be found that there (was) only one peak at 35.35° which (could) be indexed to (0 0 2) plane. It means that the XXX crystal grows along the c-axis direction. The cleavage plane parallel to the growth direction was also tasted by XRD2, as shown in Fig 4b. There (were) two peaks at 38.11° and 65.80°, which (could) be indexed to (0 6 0) and (0 10 0) plan, respectively. The above results suggested that the grown sample (was) a single crystal of high perfection. The macroscopic defects, such as low-angle grain boundaries and inclusions of the as-grown crystal, were also checked by polarized-light microscopy in transmission configuration. Fig. 1 c (showed) a photograph of the wafer (Fig. 1 b) under polarized-light. Neither inculcations nor low angle-grain boundaries were observed on the wafer. |
3楼2011-02-27 08:45:29
