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| AFM是在针尖距离样品于纳米范围内进行测量的，在针尖与样品表面的至近距离形成一个局域化的“场”，这一局域化场有利于人们了解材料表面的纳米、分子、和原子尺度的形貌及探测原子、分子间的力和其物理与化学性质[2]。由于扫描探针显微技术不但具有纳米级分辨率，而且制样简单，可在溶液中原位进行表面成像和力学、物理、化学等性能的测量，并优于其他仪器从而得到广泛的应用[3]。AFM可通过力-距离曲线来研究物质与物质表面的相互作用，表征材料表面的许多性能，并在此基础上进一步展开性能研究[4]。图1为pH值为7时MgCl2浓度在10-4mol/L到10-2mol/L范围内的作用力随作用距离的变化关系。 |
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bingd600420(金币+25, 翻译EPI+1): 谢谢你 ！ 2011-01-16 19:50:21
| Atomic Force Microscopy (AFM) measures quantities when the probing tip is brought into nanometers distance to the sample. In the close proximity between the tip and sample surface a localized "field" is formed, which facilitates understanding of nano-scale, molecular, and atomic-scale morphology and detection of forces between atoms and molecules and its physical and chemical properties [2]. Scanning probe microscopy is widely adopted in various applications, because it offers not only nano-scale resolution, but easy sample preparation, as well as measurement of surface imaging, force, physical and chemical properties in liquids with better performance [3]. Through a force-distance curve, AFM enables study of interactions between surfaces, characterization of various surface properties, and on this basis further performance investigation [4]. The interactive force variation with respect to distance for MgCl2 with pH=7 and a concentration from 10-4mol/L to 10-2mol/L is shown in Fig.1. |
2楼2011-01-16 13:20:56
