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bingd600420(金币+25, 翻译EPI+1): 谢谢你 ！ 2011-01-16 19:50:21
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Atomic Force Microscopy (AFM) measures quantities when the probing tip is brought into nanometers distance to the sample. In the close proximity between the tip and sample surface a localized "field" is formed, which facilitates understanding of nano-scale, molecular, and atomic-scale morphology and detection of forces between atoms and molecules and its physical and chemical properties [2]. Scanning probe microscopy is widely adopted in various applications, because it offers not only nano-scale resolution, but easy sample preparation, as well as measurement of surface imaging, force, physical and chemical properties in liquids with better performance [3]. Through a force-distance curve, AFM enables study of interactions between surfaces, characterization of various surface properties, and on this basis further performance investigation [4]. The interactive force variation with respect to distance for MgCl2 with pH=7 and a concentration from 10-4mol/L to 10-2mol/L is shown in Fig.1. |
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