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6个金币求一篇文章的SCI号，
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对不起，身价就6个金币，求一篇文章的SCI号 Title: Method for absolute flatness measurement of optical surfaces Authors: Xu, Chen1 ; Chen, Lei1 ; Yin, Jiayi1 Author affiliation: 1 School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology, 200 Xiao-ling-wei, Nanjing 210094, China Source title: Applied Optics Abbreviated source title: Appl. Opt. Volume: 48 Issue: 13 Issue date: May 1, 2009 |
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xiewenfa
木虫 (小有名气)
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7楼2009-09-19 14:55:51
xiewenfa
木虫 (小有名气)
- 应助: 0 (幼儿园)
- 金币: 4362.8
- 红花: 2
- 帖子: 267
- 在线: 426.9小时
- 虫号: 51880
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- 专业: 光子与光电子器件
★ ★ ★ ★ ★
happychen823(金币+5,VIP+0):谢谢你！ 9-19 14:29
happychen823(金币+5,VIP+0):谢谢你！ 9-19 14:29
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通讯作者地址: Chen, L (通讯作者), Nanjing Univ Sci & Technol, Sch Elect Engn & Optoelect Technol, 200 Xiao Ling Wei, Nanjing 210094, Peoples R China 地址: 1. Nanjing Univ Sci & Technol, Sch Elect Engn & Optoelect Technol, Nanjing 210094, Peoples R China 电子邮件地址: chenleiy@126.com 出版商: OPTICAL SOC AMER, 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA 学科类别: Optics IDS 号: 448JX |
2楼2009-09-19 14:10:40
3楼2009-09-19 14:19:20
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小木虫(金币+0.5):给个红包，谢谢回帖交流
小木虫(金币+0.5):给个红包，谢谢回帖交流
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SCI收录号为：UT WOS:000266260000017 详情： FN ISI Export Format VR 1.0 PT J TI Method for absolute flatness measurement of optical surfaces AU Xu, C Chen, L Yin, JY SO APPLIED OPTICS VL 48 IS 13 BP 2536 EP 2541 PY 2009 TC 0 AB To determine the absolute flatness deviations of optical surfaces, a novel method using two optical plates to achieve the absolute flatness test is presented. Absolute deviations of three surfaces, the rear surface of plate I and the front and rear surfaces of plate II, are obtained by four measurements. Wavefront error due to the inhomogeneity of plate II is measured beforehand and is then subtracted from the test results. Vertical profiles of the three surfaces are compared with the measurement results obtained by Zygo's three-flat application. Good agreement validates our method. The advantage of our method is that only one transmission flat is needed during the absolute test, which is especially useful for large-aperture interferometer calibration. (C) 2009 Optical Society of America UT WOS:000266260000017 SN 0003-6935 |
5楼2009-09-19 14:31:24
