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新买了台XRD，办理海关手续要教学大纲、教学计划，哪位有啊，给提供一下，应付海关的
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2楼2009-09-02 13:56:53
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帮你搜索了一下，不知道如下的课程大纲对你有帮助否？ XRD training course descriptions Software training DAY ONE (Daily class times: 9:00 a.m. to 6:00 p.m.) 1) Basic Analysis A.Opening X-ray raw data patterns ◦Multiple overlays for comparison B.Opening saved data analysis for group pattern processing C.Importing and exporting of data into non-Rigaku formats for data sharing D.Visual architecture—explanation of screen layouts, tool bars, buttons and display controls E. Data smoothing, filters, changing step size, trimming data range F.Applying a background ◦ Options and defaults, intended functionality in conjunction with other analyses 2) Search /Match A.Iterative searching styles B.Supplemental tools for searches C.Accepting defaults versus advanced features (for solid solution and highly oriented samples) D.Data mining using the PDF reference library E.Building sub files for frequently used references F.Quality markers and references G.Tools for confirmation of phases ◦Including kβ templates ◦Simulations ◦Residual indicators ◦Figure of Merit 3) Statistical Pattern Information Output •Two theta positions •d-spacing and relative intensities •Creating new reference patterns in the database from experimental data or published data •Printing and report capabilities DAY TWO 1) Profile fitting A.Defining the area of the pattern and peaks B.Defaults and integrations C.Peak shapes and when to constrain variables D.Crystallite size analysis E.Percent crystallinity 2) Easy Quant using RIR method A.Coupled with Search/Match and profile fitting to determine semi-quantitative weight percents B.Internal standards C.External standards and calibration plots 3) Overview of Rietveld Refinement Four example patterns for Rietveld quantitative analysis are calculated as an introduction. DAY THREE (Optional Day) A.Overview of Rietveld Basic Operations ◦Loading phases (atomic structure phases or structure-less phases ): ◦Global parameters for refinement ◦Phase parameters for refinement ◦Refinement controls: global and phase ◦Displays and results, including report output formats for various publications B.Practical Examples: ◦Example patterns with specific features are presented to emphasize basic concepts C.Specific Topics also covered ◦Background Model Parameters-polynomial versus user defined backgrounds ◦Interpretations of statistical and graphical displays of refinements ◦Refinement operation using structure-less phases ◦Automatic atomic coordinates linking (cif, csf) ◦Internal standard calibrations for 2θ reference ◦Easy instrument properties modification- sample displacement shift theta compensating slits, thin film absorption, cylindrical specimen, etc. ◦Solid solution substitutions and site occupancy refinements ◦Rotating 3-D structure viewing and stereo projections ◦Interactive links to Search/Match for residual unmatched area D.Constraints on Variables ◦Multiple data regions can be excluded (i.e. Sample holder or substrate reflections) ◦Preferred orientations corrections ◦Individual FWHM profile shape fitting for turbostatic effects. ◦Lattice/crystal structure parameters ◦Selective use of phases in refinement (phases included or excluded from refinements) 关于training plan，这个参考下？ Training for use of X-ray diffraction facilities have a few levels. 1. General Training for Basic X-ray Diffraction Pre-request: none This training is for beginners to understand the radiation safety and principles of X-ray diffraction and polycrystalline phase identification. It includes radiation induction and operating procedures for use of Philips MPD, PW1830 or PW1729 units. If you have large amount of powder samples with the quantity enough to fill the volume of 25 diameter x 5 mm high, you should join the training for MPD system; If you have bulk samples or a limited quantity of the powders, you should join the training for PW1830. Group size: 6 – 10 trainees, and Session time: 2.5 hours. 2. Training for Advanced XRD Technologies Pre-request: Trainees should have basic knowledge of radiation safety and X-ray diffraction (General XRD training). This course focuses on techniques of grazing incident diffraction and operating procedures of Philips MRD unit. This technique is mainly used for thin film analysis, that thickness of the film or coating is less than 2 micrometers. Otherwise PW1830 should be work. Group size: 6 trainees, and Session time: 2.5 hours. 3. Training for Special XRD Technologies Pre-request: Trainees should have basic knowledge of X-ray diffraction (General XRD training). The specific XRD technologies include stresses, textures, high resolution rocking curve, reciprocal space mapping and Debye-Scherrer diffraction (transmission mode diffraction). All of those measurements use Philips MRD unit. Group size: 1 – 6 trainees; Session time: 3 hours. 4. Training for XRD Analytical Software Pre-request: Trainees should have experience of instrument operation and has done some XRD measurement. The training focuses on how to use commercialised analytical software, such as X’pert HighScore plus. Group size: 10 trainees; Session time: 2 hours |
6楼2009-09-03 02:54:19
7楼2009-09-03 09:41:49