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[资源] 【资源】Atomic Force Microscopy in Process Engineering经典无重复

Atomic Force Microscopy in Process Engineering
. Introduction
.2 The atomic force microscope
.3 Cantilevers and probes
1.3.1  Effect of Probe Geometry
.4 Imaging modes
1.4.1  Contact Mode Imaging
1.4.2  Intermittent Contact (Tapping) Mode
1.4.3  Non-Contact Mode
1.4.4  Force Volume Imaging
1.4.5  Force Modulation Mode
1.4.6  Lateral/Frictional Force Mode
.5 The afm as a force sensor
.6 Calibration of afm microcantilevers
1.6.1  Calibration of Normal spring Constants
1.6.2  Calibration of Torsional and Lateral spring Constants
.7 Colloid probes
abbreviations and symbols
References
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