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题目:Optimal Test Selection of Complex Electronic Systems Based on Improved Discrete Particle Swarm Optimization Algorithm 作者:Ling Ma, Haijun Li, Xiaofeng Lv [ 发自手机版 https://muchong.com/3g ] |
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baiyuefei
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3楼2016-03-30 18:24:22
baiyuefei
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miller5356: 金币+10, ★★★★★最佳答案 2016-03-30 19:22:49
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miller5356: 金币+10, ★★★★★最佳答案 2016-03-30 19:22:49
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EI检索： Accession number: 20153201154068 Title: Optimal test selection of complex electronic systems based on improved discrete particle swarm optimization algorithm Authors: Ma, Ling1 ; Li, Haijun1 ; Lv, Xiaofeng1 Author affiliation: 1Naval Aeronautical and Astronautical University, Yantai, China Corresponding author: Ma, Ling Source title: Lecture Notes in Electrical Engineering Abbreviated source title: Lect. Notes Electr. Eng. Volume: 334 Issue date: 2015 Publication year: 2015 Pages: 549-557 Language: English ISSN: 18761100 E-ISSN: 18761119 Document type: Journal article (JA) Publisher: Springer Verlag Abstract: Optimal test selection is the important content of complex electronic system testability design. This chapter establishes the mathematical model of optimal test selection and then proposes an improved discrete particle swarm optimization algorithm to provide a solution. The algorithm designs a new fitness function according to the characteristics of test selection. In order to avoid the local optimum, an inertia weight adaptive adjustment strategy based on the group’s premature degree is proposed. The simulation results show that the algorithm proposed can achieve a global optimal solution fast and effectively. Optimization results meet all system requirements and can provide an effective guidance for optimal test selection of complex electronic systems. © Springer International Publishing Switzerland 2015. Number of references: 14 Main heading: Algorithms Controlled terms: Electronic guidance systems - Optimization - Particle swarm optimization (PSO) Uncontrolled terms: Algorithm design - Complex electronic systems - Discrete particle swarm optimization algorithm - Fitness functions - Global optimal solutions - System requirements - Test selection - Testability designs Classification code: 715.1 Electronic Equipment, non-communication - 723 Computer Software, Data Handling and Applications - 921 Mathematics - 921.5 Optimization Techniques DOI: 10.1007/978-3-319-13707-0_60 Database: Compendex Compilation and indexing terms, © 2016 Elsevier Inc. |
2楼2016-03-30 18:24:08
