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【答案】应助回帖
★ ★ ★ ★ ★ ★ ★ ★ ★ ★
感谢参与，应助指数 +1
miller5356: 金币+10, ★★★★★最佳答案 2016-03-30 17:54:44
sunshan4379: LS-EPI+1, 感谢应助！ 2016-03-30 17:55:36
EI检索：
Accession number:
20153201153879
Title:
Test point selection method research based on genetic algorithm and binary particle swarm optimization algorithm
Authors:
Lv, Xiaofeng1 ; Ma, Ling1 ; Sun, Jing1 ; Pang, Wei1
Author affiliation:
1Naval Aeronautical and Astronautical University, Yantai, China
Corresponding author:
Lv, Xiaofeng
Source title:
Lecture Notes in Electrical Engineering
Abbreviated source title:
Lect. Notes Electr. Eng.
Volume:
334
Issue date:
2015
Publication year:
2015
Pages:
577-585
Language:
English
ISSN:
18761100
E-ISSN:
18761119
Document type:
Journal article (JA)
Publisher:
Springer Verlag
Abstract:
Test point selection is the foundation of testability analysis and design. A minimal complete subset of genetic algorithm and binary particle swarm optimization algorithm is proposed to meet testability index requirements. Firstly, the mathematical model is established based on analyzing the testability problems. Then, the heuristic function is constructed to measure the pros and cons of the test set. Experimental results show that the algorithm can effectively overcome the deficiency of a single algorithm going into a local optimum and premature convergence, and improve the searching efficiency to obtain a global optimal solution quickly. © Springer International Publishing Switzerland 2015.
Number of references:
10
Main heading:
Algorithms
Controlled terms:
Genetic algorithms - Heuristic algorithms - Optimization - Particle swarm optimization (PSO)
Uncontrolled terms:
Binary particle swarm optimization - Global optimal solutions - Heuristic functions - Local optima - Pre-mature convergences - Searching efficiency - Test point selection - Testability Analysis
Classification code:
723 Computer Software, Data Handling and Applications - 723.1 Computer Programming - 921 Mathematics - 921.5 Optimization Techniques
DOI:
10.1007/978-3-319-13707-0_63
Database:
Compendex
Compilation and indexing terms, © 2016 Elsevier Inc. |
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