24小时热门版块排行榜

返回列表

【奖励】本帖被评价21次，作者bio-polymer增加金币 18.25 个

当前主题已经存档。

当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖

bio-polymer

至尊木虫 (职业作家)

应助: 2 (幼儿园)
贵宾: 0.575
金币: 16881.3
帖子: 3348
在线: 352.3小时
虫号: 112656

[资源] 《High Resolution X-Ray Diffractometry And Topography》

High Resolution X-Ray Diffractometry And Topography
By D.K. Bowen, Brian K. Tanner

Publisher: CRC
Number Of Pages: 252
Publication Date: 1998-02-05
ISBN-10 / ASIN: 0850667585
ISBN-13 / EAN: 9780850667585
Binding: Hardcover

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

Summary: A review
Rating: 5

This is a new generation book. Most books available in the field cover the whole history of the X-ray scattering theories and applications. Then, specific applications that are very important in our days for industries and scientific researches are not properly treated. This book does begin where other related books have finished. The issues covered are not found anywhere else together, in a same volume, as they are here. It is fundamental to the new era of materials characterization.

http://ifile.it/lxs71ab/0850667585.zip

[ Last edited by bio-polymer on 2008-10-9 at 10:13 ]

回复此楼