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ztc1129

木虫 (小有名气)

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[交流] Springer 关于透射表征的新书（重新更新下载链接）

Transmission Electron Microscopy and Diffractometry of Materials
Fultz, Brent, Howe, James
Edition Third Edition
出版社 Springer Berlin Heidelberg
DOI 10.1007/978-3-540-73886-2
版权 2008
ISBN 978-3-540-73885-5 (Print) 978-3-540-73886-2 (Online)
学科分类化学和材料科学
学科 Chemistry, Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films, Crystallography, Solid State Physics and Spectroscopy and Physics and Applied Physics in Engineering
SpringerLink Date 2007年11月4日

About this textbook

* Successful and highly acclaimed text, now fully revised and updated to include latest developments
* Can be used as both an introductory and advanced level graduate text
* Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
* Problems for the student are appended to each chapter

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.''

John Hutchison in Journal of Microscopy

``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''

Ray Egerton in Micron

``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''

John C. H. Spence, Arizona State University

``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’

Colin Humphreys, Cambridge University

``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’

Ronald Gronsky, University of California, Berkeley
Written for:
Graduate and undergraduate students, researchers
Keywords:

* Diffraction
* Electron microscopy
* Imaging
* Materials characterization
* Spectroscopy
* diffraction
* imaging
* materials characterization
* spectroscopy
http://www.namipan.com/d/TEM%20and%20Diffractometry%20of%20mater.rar/0873acdfc75c23936acc3692a1e4d8796b42bb4f06fbe702
新的网盘链接文件，这个版本的文件是pdf包文件，得用acrobat8及以上版本可打开
由于文件比较大，请大家尽量用纳米机器人下，否则可能速度会比较慢
http://www.namipan.com/d/TEM%20and%20Diffractometry%20of%20Mater.pdf/213a0b4d468f0a2c42435aec17c08bb0b93dcc857936f002

[ Last edited by ztc1129 on 2008-8-27 at 09:50 ]

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