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The morphology of the materials was observed by scanning electron microscope (SEM) after gold coating using SEM-JEOL, JSM- 5600 model operated at an accelerating voltage of 20 kV. The surface topology of the fractured surface was investigated by means of atomic force microscopy (AFM) Seiko SPI3800N, series SPA-400 (Tokyo, Japan). High resolution transmission electron microscopic (HR-TEM) images were recorded using JOEL, JEM 2100 electron microscope operated at 200 kV. The surface roughness of the samples was analyzed. X-ray diffraction (XRD) patterns were recorded for nanocomposites having varied POSS percentages at room temperature by monitoring the diffraction angle 2h from 10 to 90 on a Rich Seifert (Model 3000) X-ray powder diffractometer. The diffractometer was equipped with a Copper target (k 1.5405 A) radiation using Guinier type camera used as focusing geometry and a solid state detector. Curved nickel crystal was used as the monochromator. |
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