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2.5. Characterization 2.5.1. Fourier transform infrared spectroscopy (FTIR) The spectroscopic analyses of samples were carried out using a Fourier transform infrared spectrometer (Nicolet 6700, Thermo Scientific, USA). Spectra in the wavenumber range of 4000–400 cm−1were collected over 36 scans with a resolution of 2 cm−1. The test specimens were vacuum-dried and then prepared by the KBr-disk method. 2.5.2. Wide-angle X-ray diffraction (WXRD) Wide-angle X-ray diffraction (WXRD) was recorded on an X-ray diffractometer (X’Pert pro MPD, Philips), by using Cu K radiation ( λ= 15.405) at 40 kV and 30 mA with a scan rate of 4◦ min−1. The diffraction angle ranged from 3 to 40◦. 2.5.3. Scanning electron microscopy (SEM) and optical microscopy (OM) The dried hydrogel samples were fractured after immersing them in liquid nitrogen for the purpose of analyzing the internal morphologies (transversal view) of the samples. The samples were gold-coated in a JUC-500 Magnetron Sputtering Device (JEOL,Tokyo, Japan), and a Field Emission Scanning Electron Microscope (FESEM, INSPECT F, FEI, the Netherlands) was used for the observationof the cross section of the samples. The surface morphologies of pristine graphite and graphite oxide were also observed by FESEM. |
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