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[资源] 扫描电子显微镜实践手册：电子和离子探针分析（英文版）

Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis

Author(s): J. I. Goldstein, H. Yakowitz, D. E. Newbury (auth.), Joseph I. Goldstein, Harvey Yakowitz (eds.)
Publisher: Springer US
Year: 1975
Language: English
Pages: 597
Table of contents :
Content:
Front Matter....Pages i-xviii
Introduction....Pages 1-19
Electron Optics....Pages 21-48
Electron Beam-Specimen Interaction....Pages 49-94
Image Formation in the Scanning Electron Microscope....Pages 95-148
Contrast Mechanisms of Special Interest in Materials Science....Pages 149-210
Specimen Preparation, Special Techniques, and Applications of the Scanning Electron Microscope....Pages 211-262
X-Ray Spectral Measurement and Interpretation....Pages 263-297
Microanalysis of Thin Films and Fine Structure....Pages 299-326
Methods of Quantitative X-Ray Analysis Used in Electron Probe Microanalysis and Scanning Electron Microscopy....Pages 327-372
Computational Schemes for Quantitative X-Ray Analysis: On-Line Analysis with Small Computers....Pages 373-400
Practical Aspects of X-Ray Microanalysis....Pages 401-434
Special Techniques in the X-Ray Analysis of Samples....Pages 435-489
Biological Applications: Sample Preparation and Quantitation....Pages 491-527
Ion Microprobe Mass Analysis....Pages 529-572
Back Matter....Pages 573-582

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2015-01-10 08:47:12, 7.54 M